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Terahertz Spectroscopy: Ellipsometry and Active Polarization Control of Terahertz Waves

  • Makoto Kuwata-Gonokami
Chapter
Part of the Springer Series in Optical Sciences book series (SSOS, volume 171)

Abstract

The principles and experimental methods of terahertz (THz) wave ellipsometry are described. The procedure to determine diagonal and off-diagonal components of the complex dielectric tensor for materials using THz time domain spectroscopy in transmission and oblique reflection geometries are explained. The measured optical activity in artificial chiral grating structures is also described as applications of this technique.

Keywords

Optical Activity Ellipticity Angle Polarization Rotation Drude Model Dielectric Tensor 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 2012

Authors and Affiliations

  1. 1.Department of PhysicsUniversity of TokyoTokyoJapan

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