Terahertz Spectroscopy: Ellipsometry and Active Polarization Control of Terahertz Waves

  • Makoto Kuwata-Gonokami
Part of the Springer Series in Optical Sciences book series (SSOS, volume 171)


The principles and experimental methods of terahertz (THz) wave ellipsometry are described. The procedure to determine diagonal and off-diagonal components of the complex dielectric tensor for materials using THz time domain spectroscopy in transmission and oblique reflection geometries are explained. The measured optical activity in artificial chiral grating structures is also described as applications of this technique.


Optical Activity Ellipticity Angle Polarization Rotation Drude Model Dielectric Tensor 
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Copyright information

© Springer-Verlag Berlin Heidelberg 2012

Authors and Affiliations

  1. 1.Department of PhysicsUniversity of TokyoTokyoJapan

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