Simulating Patent Knowledge Contexts
Patent users such as government, inventors, and manufacturing organizations strive to identify the directions in which the new technology is advancing. The organization of patent knowledge in maps aims at outlining the boundaries of existing knowledge. This article demonstrates the methodology for simulating alternative knowledge contexts beyond the border of existing knowledge. The process starts with extracting knowledge from patents and applying self-organizing maps for presenting knowledge. The knowledge extraction model was tested earlier on patents from the United States Patent and Trademark Office. A demonstrator tool is then used to perform “what-if” type of analysis/simulation on the clusters in the dataset to see alternative knowledge contexts for the new knowledge “entity”. This may open up new directions and help to plan for the future. The demonstrator tool has been tested earlier on other datasets. The proposed knowledge context simulation shows promise for the future development and applications.
KeywordsFeature Plane United States Patent Context Descriptor Main Research Area Context Match
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- Banks, J., Carson II, J.S., Nelson, L.B., Nicol, D.M.: Discrete-event system simulation, International edition. International Series in Industrial and Systems Engineering. Prentice-Hall, Upper Saddle River (2005)Google Scholar
- Kantola, J., Piirto, A., Toivonen, J., Vanharanta, H.: Simulation with Occupational Work Role Competences. In: Proceeding of Conference on Grand Challenges in Modeling and Simulation (GCMS 2009), Istanbul, Turkey, July 13-16 (2009)Google Scholar
- Kaski, S., Kohonen, T.: Exploratory data analysis by the self-organizing map: structures of welfare and poverty in the world. In: Apostolos, P.N., Refenes, Y.A.-M., Moody, J., Weigend, A. (eds.) Neural Networks in Financial Engineering, pp. 498–507. World Scientific, Singapore (1996)Google Scholar
- Mooers, C.: Descriptors. In: Encyclopedia of Library and Information Science, vol. 7, pp. 31–45. Marcel Dekker (1972)Google Scholar
- Pegden, C.D., Shannon, R.E., Sadowski, R.P.: Introduction to Simulation Using SIMAN, 2nd edn. McGraw-Hill, New York (1995)Google Scholar
- Segev, A., Kantola, J.: Knowledge Discovery System for Patents. In: 7th International Conference on Knowledge Management (ICKM 2010), Pittsburgh, Pennsylvania, USA, October 22-23 (2010)Google Scholar
- Siegel, M., Madnick, S.E.: A metadata approach to resolving semantic conflicts. In: Proceedings of the 17th International Conference on Very Large Data Bases, pp. 133–145 (1991)Google Scholar
- Ultsch, A.: Self organized feature planes for monitoring and knowledge acquisition of a chemical process. In: The International Conference on Artificial Neural Networks, pp. 864–867. Springer, London (1993)Google Scholar