Abstract
The embedding algorithm which hide information by flipping block central pixel is the most practical and transparent method of the binary text image embedding algorithms. According to the change of binary text image run statistical regularity caused by data hiding, a new blind steganalysis method aimed at this kind of data hiding method based on support vector machine and secondary data hiding is presented in this paper. Experimental results show that, under the condition of less training samples higher synthesis test accuracy of the steganalysis for Yang’s and Wu’s data hiding methods can be realized by this method.
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Bao-Jian, G., Jun, W., Liang-guang, X. (2012). Steganalysis of Data Hiding in Binary Text Images Based on SVM and Run-Length Statistic. In: Hu, W. (eds) Advances in Electric and Electronics. Lecture Notes in Electrical Engineering, vol 155. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-28744-2_9
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DOI: https://doi.org/10.1007/978-3-642-28744-2_9
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-28743-5
Online ISBN: 978-3-642-28744-2
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