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On the Road to Multi-Probe Non-Contact AFM

  • T. VančuraEmail author
  • S. Schmitt
  • V. Friedli
  • S. Torbrügge
  • O. Schaff
Conference paper
Part of the Advances in Atom and Single Molecule Machines book series (AASMM)

Abstract

This contribution highlights some important aspects that have to be considered when building a multi-probe non-contact AFM. Specifically the requirements on the control system for such applications are considered.

Keywords

Multi-probe microscopy Multi-probe control system Non-contact AFM SPECS Nanonis Length extension resonator LER KolibriSensor LabVIEW SPM control system Programming interface 

References

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Copyright information

© Springer-Verlag Berlin Heidelberg 2012

Authors and Affiliations

  • T. Vančura
    • 1
    Email author
  • S. Schmitt
    • 1
  • V. Friedli
    • 1
  • S. Torbrügge
    • 1
  • O. Schaff
    • 1
  1. 1.SPECS Surface Nano Analysis GmbHBerlinGermany

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