Surface Conductance Measurements on a MoS2 Surface Using a UHV-Nanoprobe System
We present detailed information about the first experiments performed on the A*STAR UHV-Nanoprobe system in Singapore. As a model system, naturally occurring MoS2 surface was considered for those measurements. This surface is interesting as it is easy to prepare and shows a surface band gap of about 1.3 eV close to that of a Si(100)H surface. Two tip surface I–V measurements were performed by varying the inter-tip distance down to 100 nm. A transition from nonlinear to linear I–V characteristics are seen when the 2 tip separation is below 1 μm.
KeywordsUHV-Nanoprobe Scanning electron microscope (SEM) Conductivity MoS2 Molecular electronics
The authors wish to thank the A*STAR VIP “Atom Technology” project under project no. 1021100972 and the European AtMol Integrated Project funding under the contract no. 270028.