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Tools to Characterize Nanomaterials

  • B S Murty
  • P Shankar
  • Baldev Raj
  • B B Rath
  • James Murday
Chapter

Abstract

The characterization of small structures or small-sized materials in the nanometric-scale usually calls for sophisticated characterization tools. Characterization of nanomaterials and nanostructures has been largely based on certain critical advancement of conventional characterization methods developed for bulk materials. For example, X-ray diffraction (XRD) has been widely used for the determination of crystalline character, crystallite size, crystal structures and lattice constants of nanoparticles, nanowires and thin films. Scanning electron microscopy (SEM) and transmission electron microscopy (TEM), together with electron diffraction, have been commonly used in the characterization of nanoparticles to get an idea of the size, shape and defects present in these materials.

Keywords

Atomic Force Microscope Scanning Tunnelling Microscope Atom Probe Electron Energy Loss Spectroscopy Tunnelling Current 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Universities Press (India) Private Limited 2013

Authors and Affiliations

  • B S Murty
    • 1
  • P Shankar
    • 2
  • Baldev Raj
    • 3
  • B B Rath
    • 4
  • James Murday
    • 5
  1. 1.Indian Institute of Technology MadrasMadrasIndia
  2. 2.Nehru College of Engineering and TechnolCoimbatoreIndia
  3. 3.International Institute of WeldingIndian National Academy of EngineeringCoimbatoreIndia
  4. 4.Materials Science and Component TechnologyNaval Research LaboratoryWashingtonUSA
  5. 5.Washington Center, Office of Research AdvancementUniversity of Southern CaliforniaWashingtonUSA

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