Abstract
The concurrent error detection capability can give countermeasure to recent developed fault-based cryptanalysis. The design-for-testability is one of evaluated indexes to detect the faulty element of VLSI chips for manufacturability and maintainability issues. Thus, design of multipliers in GF(2m) with both concurrent error detection and design-for-testability is an important issue for elliptic curve cryptosystem. In this study, a novel self-checking alternating logic (SCAL) multiplier in GF(2m) is presented for achieving both on-line test and off-line test purposes. The proposed polynomial basis multiplier using irreducible trinomials requires only about 33% extra space complexity of existing multipliers. As our best knowledge, the proposed polynomial basis multiplier is the first polynomial basis multiplier which can provide both on-line error detection and off-line test capabilities.
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Chang, C.H., Tuan, CC., Huang, WT., Chiou, C.W. (2012). On-Line Error Detection and Off-Line Test Design in Polynomial Basis Multiplier over GF(2m) Using Irreducible Trinomials. In: Zhu, M. (eds) Business, Economics, Financial Sciences, and Management. Advances in Intelligent and Soft Computing, vol 143. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-27966-9_104
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DOI: https://doi.org/10.1007/978-3-642-27966-9_104
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