Qualitative Analysis (Principle and Spectral Interpretation)

Chapter
Part of the Springer Series in Surface Sciences book series (SSSUR, volume 49)

Abstract

Electron spectroscopy is based on the element-specific binding energy of electrons in the atomic shell and their determination by electron spectrometers.

Keywords

Auger Electron Auger Peak Auger Transition Valence Band Spectrum Direct Spectrum 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

References

  1. 3.1.
    J.F. Watts, J. Wolstenholme, An Introduction to Surface Analysis by XPS and AES (Wiley, Chichester, 2003)CrossRefGoogle Scholar
  2. 3.2.
    M. Thompson, M.D. Baker, A. Christie, J.F. Tyson, Auger Electron Spectroscopy (Wiley, New York, 1985)Google Scholar
  3. 3.3.
    D. Briggs, J.C. Rivière, Spectral Interpretation, in Practical Surface Analysis Vol. 1 (AES and XPS), 2nd edn., ed. by D. Briggs, M.P. Seah (Wiley, Chichester, 1990), pp. 85–141Google Scholar
  4. 3.4.
    M.P. Seah, I.S. Gilmore, S.J. Spencer, Surf. Interface Anal. 26, 617 (1998)CrossRefGoogle Scholar
  5. 3.5.
    M.P. Seah, Instrument Calibration for AES and XPS, in Surface Analysis by Auger and Photoelectron Spectroscopy, ed. by D. Briggs, J.T. Grant (IM Publications, Chichester, 2003), pp. 167–189Google Scholar
  6. 3.6.
    J.F. Moulder, W.F. Stickle, P.E. Sobol, K.D. Bomben, Handbook of X-Ray Photoelectron Spectroscopy (Perkin–Elmer Corp., Physical Electronics Division, Eden Prairie, 1992)Google Scholar
  7. 3.7.
    N. Ikeo, Y. Iijima, N. Niimura, M. Sigematsu, T. Tazawa, S. Matsumoto, K. Kojima, Y. Nagasawa, Handbook of X-ray Photoelectron Spectroscopy (JEOL, Akishima, 1991)Google Scholar
  8. 3.8.
    T. Sekine, Y. Nagasawa, M. Kudo, Y. Sakai, A.S. Parker, J.D. Geller, A. Mogami, K. Hirata, Handbook of Auger Electron Spectroscopy (JEOL, Tokyo, 1982)Google Scholar
  9. 3.9.
    K.D. Childs, B.A. Carlson, L.A. LaVanier, J.F. Moulder, D.F. Paul, W.F. Stickle, D.G. Watson, Handbook of Auger Electron Spectroscopy, 3rd edn. (Physical Electronics Inc., Eden Prairie, 1995)Google Scholar
  10. 3.10.
    C.D. Wagner, A.V. Naumkin, A. Kraut-Vass, J.W. Allison, C.J. Powell, J.R. Rumble, NIST X-Ray Photoelectron Spectroscopy Database, SRD 20, Version 3.5 (National Institute of Standards and Technology, Gaithersburg, 2008), http://srdata.nist.gov/xps/
  11. 3.11.
    Common Data Processing System (COMPRO). www.sasj.gr.jp/COMPRO/index.html
  12. 3.12.
    J.T. Grant, Databases, in Surface Analysis by Auger and Photoelectron Spectroscopy, ed. by D. Briggs, J.T. Grant (IM Publications, Chichester, 2003), pp. 869–873Google Scholar
  13. 3.13.
    S. Hüfner, Unfilled InnerShells: Transition Metals and Compounds, in Photoemission in Solids II, ed. by L. Ley, M. Cardona (Springer, Berlin-Heidelberg-New York, 1979), pp. 173–216CrossRefGoogle Scholar
  14. 3.14.
    S. Hüfner, Photoelectron Spectroscopy, 3rd edn. (Springer, Berlin, 2003)Google Scholar
  15. 3.15.
    A. Rosencwaig, G.K. Wertheim, J. Electron Spectrosc. Relat. Phenom. 1, 493 (1973)CrossRefGoogle Scholar
  16. 3.16.
    K. Siegbahn, C.N. Nordling, A. Fahlman, R. Nordberg, K. Hamrin, J. Hedman, G. Johansson, T. Bermark, S.E. Karlsson, ESCA: Atomic, Molecular and Solid State Structure Studied by Means of Electron Spectroscopy (Almqvist and Wiksells, Uppsala, 1967)Google Scholar
  17. 3.17.
    U. Gelius, Phys. Scr. 9, 133 (1974)ADSCrossRefGoogle Scholar
  18. 3.18.
    L. Kövér, Chemical Effects in XPS, in Surface Analysis by Auger and Photoelectron Spectroscopy, ed. by D. Briggs, J.T. Grant (IM Publications, Chichester, 2003), pp. 421–464Google Scholar
  19. 3.19.
    L.P.H. Jeurgens, F. Reichel, S. Frank, G. Richter, E.J. Mittemeijer, Surf. Interface Anal. 40, 259 (2008)CrossRefGoogle Scholar
  20. 3.20.
    S. Hofmann, J.M. Sanz, Fres. Z. Anal. Chem. 314, 215 (1983)CrossRefGoogle Scholar
  21. 3.21.
    C.D. Wagner, Anal. Chem. 44, 967 (1972)CrossRefGoogle Scholar
  22. 3.22.
    S.W. Gaarenstrom, N. Winograd, J. Chem. Phys. 67, 3500 (1977)ADSCrossRefGoogle Scholar
  23. 3.23.
    C.D. Wagner, A. Joshi, J. Electron Spectrosc. Relat. Phenom. 47, 283 (1988)CrossRefGoogle Scholar
  24. 3.24.
    G. Moretti, J. Electron Spectrosc. Relat. Phenom. 95, 95 (1998)CrossRefGoogle Scholar
  25. 3.25.
    R.H. West, J.E. Castle, Surf. Interface Anal. 4, 86 (1982)CrossRefGoogle Scholar
  26. 3.26.
    G. Moretti, Surf. Interface Anal. 17, 352 (1991)CrossRefGoogle Scholar
  27. 3.27.
    T.D. Thomas, J. Electron Spectrosc. Relat. Phenom. 20, 117 (1980)CrossRefGoogle Scholar
  28. 3.28.
    J.C. Rivière, J.A.A. Crossley, G. Moretti, Surf. Interface Anal. 14, 257 (1989)CrossRefGoogle Scholar
  29. 3.29.
    I.leR. Strydom, S. Hofmann, Vacuum 41, 1619 (1990)Google Scholar
  30. 3.30.
    M.-L. Abel, P. Tsakiropoulos, J.F. Watts, J.A.D. Matthew, Surf. Interface Anal. 34, 775 (2002)CrossRefGoogle Scholar
  31. 3.31.
    L.P.H. Jeurgens, W.G. Sloof, C.G. Borsboom, F.D. Tichelaar, E.J. Mittemeijer, Appl. Surf. Sci. 161, 139 (2000)ADSCrossRefGoogle Scholar
  32. 3.32.
    L.P.H. Jeurgens, W.G. Sloof, C.G. Borsboom, F.D. Tichelaar, E.J. Mittemeijer, Appl. Surf. Sci. 144145, 11 (1999)CrossRefGoogle Scholar
  33. 3.33.
    W. Pamler, Surf. Interface Anal. 13, 55 (1988)CrossRefGoogle Scholar
  34. 3.34.
    D. Briggs, V.A. Gibson, Chem. Phys. Lett. 25, 493 (1974)ADSCrossRefGoogle Scholar
  35. 3.35.
    G.K. Wertheim, Phys. Rev. B 25, 1987 (1982)ADSCrossRefGoogle Scholar
  36. 3.36.
    P.M.A. Sherwood, Data Analysis in XPS and AES, in Practical Surface Analysis Vol. 1 (AES and XPS), 2nd edn., ed. by D. Briggs, M.P. Seah (Wiley, Chichester, 1990), pp. 555–586Google Scholar
  37. 3.37.
    N. Fairley, XPS Lineshapes and Curve Fitting, in Surface Analysis by Auger and Photoelectron Spectroscopy, ed. by D. Briggs, J.T. Grant (IM Publications, Chichester, 2003), pp. 421–464Google Scholar
  38. 3.38.
    S. Doniach, M. Sunjic, J. Phys. C 3, 285 (1970)ADSCrossRefGoogle Scholar
  39. 3.39.
    G.K. Wertheim, P.H. Citrin, Fermi Surface Excitations in X-Ray Photoemission Line Shapes from Metals, in Photoemission in Solids I, ed. by M. Cardona, L. Ley (Springer, Berlin/Heidelberg, 1978), pp. 197–236Google Scholar
  40. 3.40.
    G.K. Wertheim, L.R. Walker, J. Phys. F. Metal Phys. 6, 2297 (1976)ADSCrossRefGoogle Scholar
  41. 3.41.
    G.K. Wertheim, S. Huefner, J. Inorg. Nucl. Chem. 38, 1701 (1976)CrossRefGoogle Scholar
  42. 3.42.
    I. Olefjord, H.J. Mathieu, P. Marcus, Surf. Interface Anal. 15, 681 (1990)CrossRefGoogle Scholar
  43. 3.43.
    C.S. Fadley, Prog. Surf. Sci. 16, 275 (1984)ADSCrossRefGoogle Scholar
  44. 3.44.
    C.S. Fadley, Nucl. Instrum. Methods Phys. Res. A 601, 8 (2009)ADSCrossRefGoogle Scholar
  45. 3.45.
    G. Grenet, Y. Jugnet, S. Holmberg, H.C. Poon, Tran Minh Duc, Surf. Interface Anal. 34, 367 (2003)Google Scholar
  46. 3.46.
    Y. Nihei, Surf. Interface Anal. 35, 45 (2003)CrossRefGoogle Scholar
  47. 3.47.
    M. El Kazzi, G. Grenet, C. Merckling, G. Saint-Girons, C. Botella, O. Marty, G. Hollinger, Phys. Rev. B 79, 195312 (2009)ADSCrossRefGoogle Scholar
  48. 3.48.
    P.J. Orders, S. Kono, C.S. Fadley, R. Trehan, J.T. Lloyd, Surf. Sci. 119, 371 (1982)ADSCrossRefGoogle Scholar
  49. 3.49.
    I. Morawski, M. Nowicki, Phys. Rev. B 75, 155412 (2007)ADSCrossRefGoogle Scholar
  50. 3.50.
    A. Chasse, L. Niebergall, Yu. Kucherenko, Surf. Sci. 501, 244 (2002)ADSCrossRefGoogle Scholar
  51. 3.51.
    Y. Kisaka, A. Hashimoto, A. Suzuki, S. Miyasaka, M. Nojima, M. Owari, Y. Nihei, Surf. Interface Anal. 40, 1646 (2008)CrossRefGoogle Scholar
  52. 3.52.
    J. Osterwalder, Structural Effects in XPS and AES: Diffraction, in Surface Analysis by Auger and Photoelectron Spectroscopy, ed. by D. Briggs, J.T. Grant (IM Publications, Chichester, 2003), pp. 557–585Google Scholar
  53. 3.53.
    S. Omori, Y. Nihei, E. Rotenberg, J.D. Denlinger, S.D. Kevan, B.P. Tonner, M.A. Van Hove, C.S. Fadley, Phys. Rev. Lett. 88(55), 504 (2002)Google Scholar
  54. 3.54.
    T. Matsushita, F. Zhun Guo, F. Matsui, Y. Kato, H. Daimon, Phys. Rev. 75, 085419 (2007)CrossRefGoogle Scholar
  55. 3.55.
    S.A. Chambers, Surf. Sci. Rep. 16, 261 (1992)ADSCrossRefGoogle Scholar
  56. 3.56.
    L. Kubler, F. Lutz, J.L. Bischoff, D. Bolmont, Surf. Sci. 251/252, 305 (1991)Google Scholar
  57. 3.57.
    J.C. Vickerman (ed.), Surface Analysis (Wiley, Chichester, 1997)Google Scholar
  58. 3.58.
    J.M. Walls, Methods of Surface Analysis (Cambridge University Press, Cambridge, 1989)Google Scholar
  59. 3.59.
    S. Hofmann, Auger Electron Spectroscopy, in Wilson and Wilson’s Comprehensive Analytical Chemistry, vol. IX, ed. by G. Svehla (Elsevier, Amsterdam, 1979), pp. 89–172Google Scholar
  60. 3.60.
    D. Chattarji, The Theory of Auger Transitions (Academic, London, 1976)Google Scholar
  61. 3.61.
    M.F. Chung, L.H. Jenkins, Surf. Sci. 22, 479 (1970)ADSCrossRefGoogle Scholar
  62. 3.62.
    J.A. Bearden, A.F. Burr, Rev. Mod. Phys. 39, 125 (1967)ADSCrossRefGoogle Scholar
  63. 3.63.
    W.A. Coghlan, R.E. Clausing, USAEC Rep. ORNL-TM-3676 (U.S. Dept. of Commerce, Springfield, 1971)Google Scholar
  64. 3.64.
    D. Coster, R.L. Kronig, Physica 2, 13 (1935)ADSCrossRefMATHGoogle Scholar
  65. 3.65.
    J. Erlewein, Ph.D. thesis, University of Stuttgart, Stuttgart, 1977Google Scholar
  66. 3.66.
    H.E. Bishop, J.C. Riviere, Appl. Phys. Lett. 16, 21 (1970)ADSCrossRefGoogle Scholar
  67. 3.67.
    J.P. Langeron, Surf. Interface Anal. 14, 381 (1989)CrossRefGoogle Scholar
  68. 3.68.
    G.C. Smith, M.P. Seah, Surf. Interface Anal. 16, 144 (1990)CrossRefGoogle Scholar
  69. 3.69.
    T. Sekine, N. Ikeo, Y. Nagasawa, Appl. Surf. Sci. 100/101, 30 (1996)Google Scholar
  70. 3.70.
    D.E. Ramaker, Crit. Rev. Solid State Mater. Sci. 17, 211 (1991)ADSCrossRefGoogle Scholar
  71. 3.71.
    D.E. Ramaker, J. Electron Spectrosc. Relat. Phenom. 66, 269 (1994)CrossRefGoogle Scholar
  72. 3.72.
    D.E. Ramaker, Chemical Information from Auger Lineshapes, in Surface Analysis by Auger and Photoelectron Spectroscopy, ed. by D. Briggs, J.T. Grant (IM Publications, Chichester, 2003), pp. 465–500Google Scholar
  73. 3.73.
    A.P. Dementjev, K.I. Maslakova, A.V. Naumkin, Appl. Surf. Sci. 245, 128 (2005)ADSCrossRefGoogle Scholar
  74. 3.74.
    S. Hofmann, J. Steffen, Surf. Interface Anal. 14, 59 (1989)CrossRefGoogle Scholar
  75. 3.75.
    Z.-J. Ding, R. Shimizu, Electron Backscattering and Channeling, in Surface Analysis by Auger and Photoelectron Spectroscopy, ed. by D. Briggs, J.T. Grant (IM Publications, Chichester, 2003), pp. 587–618Google Scholar
  76. 3.76.
    M. Prutton, I.R. Barkshire, M.M. El Gomati, J.C. Greenwood, P.G. Kenny, H. Roberts, Surf. Interface Anal. 18, 295 (1992)CrossRefGoogle Scholar
  77. 3.77.
    D.J. Szostak, H. Thomas, Surf. Interface Anal. 1, 312 (1988)CrossRefGoogle Scholar
  78. 3.78.
    F. Yubero, S. Tougaard, E. Elizalde, J.M. Sanz, Surf. Interface Anal. 20, 719 (1993)CrossRefGoogle Scholar
  79. 3.79.
    G. Gergely, Surf. Interface Anal. 3, 201 (1981)CrossRefGoogle Scholar
  80. 3.80.
    F. Yubero, S. Tougaard, Phys. Rev. B 46, 2486 (1992)ADSCrossRefGoogle Scholar
  81. 3.81.
    G.G. Fuentes, E. Elizalde, F. Yubero, J.M. Sanz, Surf. Interface Anal. 33, 230 (2002)CrossRefGoogle Scholar
  82. 3.82.
    B. Akamatsu, P. Henoc, F. Maurice, C. Le Gressus, K. Raouadi, T. Sekine, T. Sakai, Surf. Interface Anal. 15, 7 (1990)CrossRefGoogle Scholar
  83. 3.83.
    Y. Sakai, A. Mogami, J. Vac. Sci. Technol. A 5, 1222 (1987)ADSCrossRefGoogle Scholar
  84. 3.84.
    D.G. Frank, A.T. Hubbard, Auger Microscopy, Angular Distribution, in Concise Encyclopedia of Materials Characterization, ed. by R.W. Cahn, E. Lifshin (Pergamon Press, Oxford, 1993), pp. 34–41Google Scholar
  85. 3.85.
    P. Lejček, A. Rar, S. Hofmann, Surf. Interface Anal. 34, 375 (2002)CrossRefGoogle Scholar
  86. 3.86.
    C.J. Powell, J. Electron Spectrosc. Relat. Phenom. 185, 1 (2012)CrossRefGoogle Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 2013

Authors and Affiliations

  1. 1.Max-Planck-Institute for Intelligent Systems (formerly Max-Planck-Institute for Metals Research)StuttgartGermany

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