The Research of Transparent Material Thickness Detection System Based on CCD

Chapter
Part of the Lecture Notes in Electrical Engineering book series (LNEE, volume 129)

Abstract

This paper proposes a transparent material thickness detecting system based on CCD sensor, in order to achieve non-contact on-line detection of transparent material thickness parameter. The system utilizes the principle that the displace error is different between the upper and lower surface of the transparent medium, which is simple in structure, high precision in measurement, and more convenient than the measuring solutions before. This design can solve the thickness and size detection problems of optical glass, optical crystal and optical transparent Polymer Material (or optical plastics).The measurement range is 1-10mm, and measuring accuracy is ±0.01mm.

Keywords

Transparent Material Wave Pulse Signal High Speed Data Acquisition System Optical Plastic Optical Pulse Signal 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

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    Tojo, F., Hirakawa, S., Toyoda, T., et al.: New Method of Sheet Thickness Inspection: Improvement in the Accuracy of the Thickness Measuring System during the Manufacturing Process, pp. 320–323. IEEE (2004)Google Scholar

Copyright information

© Springer-Verlag GmbH Berlin Heidelberg 2012

Authors and Affiliations

  1. 1.School of Opto-Electronics EngineeringChangchun University of Science and Technology, (CUST)ChangchunP.R. China

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