Abstract
The problem of point selection is very important for system testability design. In this paper, a method based on Clonal Selection Algorithm (CSA) and multi-signal model is proposed to select the optimum test set of complex system. The problem of test selection is transformed into an integer programming problem through building multi-signal model. Then, the CSA-based method is used to search the optimal test set for system. The method can not only avoid the local optimization and premature convergence, but also improve the searching efficiency. The experimental results indicate that the proposed method is easier to find the optimum test sets with high effectiveness and acceptable time consumption.
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Liu, H., Wu, J., Chen, G. (2011). Test Selection for Complex System Based on Clonal Selection Algorithm. In: Wang, Y., Li, T. (eds) Practical Applications of Intelligent Systems. Advances in Intelligent and Soft Computing, vol 124. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-25658-5_27
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DOI: https://doi.org/10.1007/978-3-642-25658-5_27
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-25657-8
Online ISBN: 978-3-642-25658-5
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