Model-Based Coverage-Driven Test Suite Generation for Software Product Lines
Abstract
Software Product Line (SPL) engineering is a popular approach for the systematic reuse of software artifacts across a large number of similar products. Unfortunately, testing each product of an SPL separately is often unfeasible. Consequently, SPL engineering is in conflict with standards like ISO 26262, which require each installed software configuration of safety-critical SPLs to be tested using a model-based approach with well-defined coverage criteria.
In this paper we address this dilemma and present a new SPL test suite generation algorithm that uses model-based testing techniques to derive a small test suite from one variable 150% test model of the SPL such that a given coverage criterion is satisfied for the test model of every product. Furthermore, our algorithm simplifies the subsequent selection of a small, representative set of products (w.r.t. the given coverage criterion) on which the generated test suite can be executed.
Keywords
Test Model Test Suite Software Product Line Coverage Criterion Alarm SystemPreview
Unable to display preview. Download preview PDF.
References
- 1.Oster, S., Wübbeke, A., Engels, G., Schürr, A.: Model-Based Software Product Lines Testing Survey. In: Zander, J., Schieferdecker, I., Mosterman, P. (eds.) Model-based Testing for Embedded Systems. CRC Press/Taylor&Francis (2011)Google Scholar
- 2.ISO: ISO - International Organization for Standardization. Website (2011), http://www.iso.org/iso/ (visited on May 2, 2011)
- 3.Scheidemann, K.: Verifying Families of System Configurations. PhD thesis, TU Munich (2007)Google Scholar
- 4.Engström, E., Skoglund, M., Runeson, P.: Empirical evaluations of regression test selection techniques. In: Rombach, H.D., Elbaum, S.G., Münch, J. (eds.) Proc. of ESEM 2008, pp. 22–31 (2008)Google Scholar
- 5.Grönniger, H., Krahn, H., Pinkernell, C., Rumpe, B.: Modeling Variants of Automotive Systems using Views. In: Modellierung (2008)Google Scholar
- 6.Jain, T.K., Kushwaha, D.S., Misra, A.K.: Optimization of the Quine-McCluskey Method for the Minimization of the Boolean Expressions. In: Proc. of the ICAS 2008, pp. 165–168. IEEE, Los Alamitos (2008)Google Scholar
- 7.Kang, K.C., Cohen, S.G., Hess, J.A., Novak, W.E., Peterson, A.S.: Feature-Oriented Domain Analysis (FODA) Feasibility Study. Technical report, Carnegie-Mellon University Software Engineering Institute (1990)Google Scholar
- 8.Souza, S., Maldonado, J., Fabbri, S., Masiero, P.: Statecharts Specifications: A Family of Coverage Testing Criteria. In: CLEI 2000 (2000)Google Scholar
- 9.Haschemi, S.: Azmun - The Model-Based Testing Framework. Website (2011), http://www.azmun.de (visited on May 2, 2011)
- 10.Cichos, H., Oster, S., Lochau, M., Schürr, A.: Extended Version of Model-based Coverage-Driven Test Suite Generation for Software Product Lines. Technical Report 07, TU Braunschweig (2011)Google Scholar
- 11.Cichos, H., Heinze, T.S.: Efficient Test Suite Reduction by Merging Pairs of Suitable Test Cases. In: Dingel, J., Solberg, A. (eds.) MODELS 2010. LNCS, vol. 6627, pp. 244–258. Springer, Heidelberg (2011)CrossRefGoogle Scholar
- 12.Fraser, G., Wotawa, F., Ammann, P.: Testing with Model Checkers: A Survey. Software Testing, Verification and Reliability 19, 215–261 (2009)CrossRefGoogle Scholar
- 13.Olimpiew, E.M.: Model-Based Testing for Software Product Lines. PhD thesis, George Mason University (2008)Google Scholar
- 14.Reuys, A., Kamsties, E., Pohl, K., Reis, S.: Model-Based System Testing of Software Product Families. In: Pastor, Ó., Falcão e Cunha, J. (eds.) CAiSE 2005. LNCS, vol. 3520, pp. 519–534. Springer, Heidelberg (2005)CrossRefGoogle Scholar
- 15.Hartmann, J., Vieira, M., Ruder, A.: A UML-based Approach for Validating Product Lines. In: Geppert, B., Krueger, C. (eds.) Proc. of the SPLiT 2004, pp. 58–65 (2004)Google Scholar
- 16.Weißleder, S., Sokenou, D., Schlingloff, H.: Reusing State Machines for Automatic Test Generation in ProductLines. In: Proc. of the MoTiP 2008 (2008)Google Scholar
- 17.Pure-Systems: pure-systems GmBH. Website (2011), http://www.pure-systems.com (visited on May 2, 2011)
- 18.Kim, C.H.P., Batory, D.S., Khurshid, S.: Reducing Combinatorics in Testing Product Lines. In: Proc. of the AOSD 2011, pp. 57–68. ACM, New York (2011)Google Scholar
- 19.Oster, S., Markert, F., Ritter, P.: Automated Incremental Pairwise Testing of Software Product Lines. In: Bosch, J., Lee, J. (eds.) SPLC 2010. LNCS, vol. 6287, pp. 196–210. Springer, Heidelberg (2010)CrossRefGoogle Scholar
- 20.Perrouin, G., Sen, S., Klein, J., Traon, B.B.Y.L.: Automated and Scalable T-wise Test Case Generation Strategies forSoftware Product Lines. In: ICST 2010, pp. 459–468 (2010)Google Scholar