Data Evaluation

Chapter
Part of the Springer Theses book series (Springer Theses)

Abstract

This chapter describes the steps taken in evaluating the data obtained in an XPCS measurement. It aims to be both methodologically thorough and helpful to the reader in reproducing the work presented here, it will therefore be very detailed.

Keywords

Dark Current Data Frame Droplet Charge Charge Cloud Dark Frame 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

References

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    F. Livet, F. Bley, J. Mainville, R. Caudron, S.G.J. Mochrie, E. Geissler, G. Dolino, D. Abernathy, G. Grübel, M. Sutton, Using direct illumination CCDs as high-resolution area detectors for X-ray scattering. Nucl. Instrum. Methods A 451, 596 (2000)CrossRefADSGoogle Scholar
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    E. Miyata, M. Miki, J. Hiraga, D. Kamiyama, H. Kouno, H. Tsunemi, K. Miyaguchi, K. Yamamoto, Mesh experiment for back-illuminated CCDs in improvement of position resolution. Nucl. Instrum. Methods A 513, 322 (2003)CrossRefADSGoogle Scholar
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    E. Miyata, M. Miki, H. Tsunemi, J. Hiraga, H. Kouno, K. Miyaguchi, (2002) Direct x-ray imaging of \(\upmu\hbox{m}\) precision using back-illuminated charge-coupled device. Jpn. J. Appl. Phys. 41, L500 (2002)Google Scholar
  4. 4.
    A. Thompson et al., X-ray data booklet (Lawrence Berkeley National Laboratory, 2001), http://xdb.lbl.gov

Copyright information

© Springer-Verlag Berlin Heidelberg 2012

Authors and Affiliations

  1. 1.Faculty of PhysicsUniversity of ViennaViennaAustria

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