Discrimination of True Defect and Indefinite Defect with Visual Inspection Using SVM

  • Yuji Iwahori
  • Kazuya Futamura
  • Yoshinori Adachi
Part of the Lecture Notes in Computer Science book series (LNCS, volume 6884)


This paper proposes a new approach to discriminate the true defect and the indefinite defect with visual distinction of the electronic board. Some classification approaches have been proposed for the limited kinds of defects and there may be some incorrect recognitions for the defect which is difficult with the visual distinction. This paper proposes the approach to reduce the incorrect recognition ratio for the defects with difficult discrimination using the margin of SVM. Real electronic board image data are tested and evaluated with the proposed approach.


Feature Selection Reference Image Defect Region Margin Region Defect Class 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.


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Copyright information

© Springer-Verlag Berlin Heidelberg 2011

Authors and Affiliations

  • Yuji Iwahori
    • 1
  • Kazuya Futamura
    • 1
  • Yoshinori Adachi
    • 2
  1. 1.Dept. of Computer ScienceChubu UniversityKasugaiJapan
  2. 2.College of Business Admin. and Info. Sci.Chubu UniversityKasugaiJapan

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