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Radiation Effects in GaN

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GaN and ZnO-based Materials and Devices

Part of the book series: Springer Series in Materials Science ((SSMATERIALS,volume 156))

Abstract

A review of electron, proton, and neutron damage in GaN and AlGaN is presented. A comparison of theoretical and experimental threshold displacement energies is given, along with a summary of energy levels introduced by different forms of radiation, carrier removal rates and role of existing defects.

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Acknowledgements

I would like to thank my long time colleagues with whom I have been working on radiation effects in III-nitrides, Prof. S.J. Pearton of the University of Florida, Prof. In-Hwan Lee of Chonbuk University in Korea, Dr. Amir Dabiran at SVT Technologies, Dr. Nikolai Smirnov and Dr. Anatoliy Govorkov at the Institute of Rare Metals, Dr. Nikolai Kolin at the Institute of Physical Chemistry in Obninsk for their help, support, and fruitful discussions. Also, useful discussions with Dr. D. C. Look and Dr. Z-Q. Fang at Wright State University are gratefully acknowledged. The work was supported in part by International Science and Technology Center ISTC grant #3870.

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Polyakov, A.Y. (2012). Radiation Effects in GaN. In: Pearton, S. (eds) GaN and ZnO-based Materials and Devices. Springer Series in Materials Science, vol 156. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-23521-4_9

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