Abstract
A review of electron, proton, and neutron damage in GaN and AlGaN is presented. A comparison of theoretical and experimental threshold displacement energies is given, along with a summary of energy levels introduced by different forms of radiation, carrier removal rates and role of existing defects.
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References
A. Ionascut-Nedelcsescu, C. Carlone, A. Houdayer, H.J. von Bardelleben, J.L. Cantin, S. Raymond, IEEE Trans. Nucl. Sci. 49, 2733 (2002)
D.C. Look, D.C. Reynolds, J.W. Hemsky, J.R. Sizelove, R.L. Jones, R.J. Molnar, Defect donor and acceptor in GaN. Phys. Rev. Lett. 79(12), 2273–2276 (1997)
J. Nord, K. Nordlund, J. Keininen, Molecular dynamics study of damage accumulation in GaN during ion beam irradiation. Phys. Rev. B. 68, 184104 (2003)
S.O. Kucheyev, J.S. Williams, C. Jagadish, Effects of ion species on the accumulation of ion-beam damage in GaN. Phys. Rev. B. 64, 035202 (2001)
D.W. Jenkins, J.D. Dow, M.-H. Tsai, J. Appl. Phys. 72, 4130 (1992)
A.Y. Polyakov, M. Shin, J.A. Freitas, M. Skowronski, D.W. Greve, R.G. Wilson, On the origin of electrically active defects in AlGaN alloys grown by organometallic vapor phase epitaxy. J. Appl. Phys. 80(11), 6349–6354 (1996)
J. Neugebauer, C.G. Van de Walle, Phys. Rev. B. 50, 8067 (1994)
P. Boguslawski, E.I. Briggs, J. Bernholc, Phys. Rev. B. 51, 17255 (1995)
D.C. Look, Z. Fang, L. Polenta, MRS Internet J. Nitride Semicond. Res. 5S1 (2000) paper W10.5
G.A. Umana-Membreno, J.M. Dell, G. Parish, B.N. Nener, L. Faraone, U.K. Mishra, 60Co g-irradiation on GaN Schottky diodes. IEEE Trans. Electron Dev. 50(12), 2326 (2003)
A.Y. Polyakov, N.B. Smirnov, A.V. Govorkov, A.V. Markov, C.R. Lee, I-H. Lee, N.G. Kolin, D.I. Merkurisov, V.M. Boiko, J.S. Wright, S.J. Pearton, Defects in electron and neutron irradiated n-GaN: disordered regions versus point defects, Abstracts of the Fall MRS 2006 Meeting: Symposium I: Advances in III-Nitrides Semiconductor Materials and Devices (MRS, Warrington, 2006) paper I7.46
K.H. Chow, L.S. Vlasenko, P. Johannesen, C. Bozdog, G.D. Watkins, Intrinsic defects in GaN. I. Ga sublattice defects observed by optically detected electron paramagnetic resonance. Phys. Rev. B 69, 045207 (2004)
L. Polenta, Z-Q. Fang, D.C. Look, On the main irradiation-induced defect in GaN. Appl. Phys. Lett. 76(15) 2086–2088 (2000)
F.D. Auret, S.A. Goodman, F.K. Koschnick, J.-M. Spaeth, B. Beaumont, P. Gibart, Appl. Phys. Lett. 74, 407 (1999)
S.A. Goodman, F.D. Auret, F.K. Koschnick, J.-M. Spaeth, B. Beaumont, P. Gibart Radiation induced defects in MOVPE grown n-GaN. Mater. Sci. Eng. B 71, 100–103 (2000)
S.A. Goodman, F.D. Auret, F.K. Koschnick, J.-M. Spaeth, B. Beaumont, P. Gibart, Appl. Phys. Lett. 74(6), 809 (1999)
F.D. Auret, S.A. Goodman, F.K. Koschnick, J.-M. Spaeth, B. Beaumont, P. Gibart, Appl. Phys. Lett. 73(25), 3745 (1998)
M. Hayes, F.D. Auret, L. Wu, W.E. Meyer, J.M. Nel, M.J. Legodi, Electrical defects introduced during high-temperature irradiation of GaN and AlGaN. Phys. B, 340–342, 421–425 (2003)
P. Hacke, T. Detchprohm, K. Hiramatsu, N. Sawaki, Appl. Phys. Lett. 63, 2676 (1993)
A.Y. Polyakov, N.B. Smirnov, A.V. Govorkov, A.V. Markov, S.J. Pearton, N.G. Kolin, D.I. Merkurisov, V.M. Boiko, Cheul-Ro Lee, In-Hwan Lee, Neutron irradiation effects in undoped n-GaN Films. J. Vac. Sci. Technol. B25(2), 436–442 (2007)
A.Y. Polyakov, A.S. Usikov, B. Theys, N.B. Smirnov, A.V. Govorkov, F. Jomard, N.M. Shmidt, W.V. Lundin, Effects of proton implantation on electrical and recombination properties of n-GaN. Solid-State Electron. 44, 1971–1983 (2000)
J. Bourgoin, M. Lannoo, Point Defects in Semiconductors II, Experimental Aspects (Springer, Berlin, 1983) chapter 6
A.Y. Polyakov, N.B. Smirnov, A.V. Govorkov, N.G. Kolin, D.I. Merkurisov, V.M. Boiko, A.V. Korulin, S.J. Pearton, Neutron transmutation doping of GaN. J. Vac. Sci. Technol. B. 28(3), 608–612 (2010)
A. Chantre, G. Vincent, D. Bois, Phys. Rev. B. 23, 5335 (1981)
G.M. Martin, A. Mitonneau, D. Pons, A. Mircea, D.W. Woodard, J. Phys. C. 13, 3855 (1980)
A.Y. Polyakov, N.B. Smirnov, A.V. Govorkov, Z.-Q. Fang, D.C. Look, R.J. Molnar, A.V. Osinsky, Deep hole traps in n-GaN films grown by hydride vapor phase epitaxy. J. Appl. Phys. 91(10), 6580–6584 (2002)
M. Linde, S.J. Uftring, G.D. Watkins, Optical detection of magnetic resonance in electron irradiated GaN. Phys. Rev. B. 55(16), R10177–10180 (1997)
I.A. Buyanova, M. Wagner, W.C. Chen, B. Monemar, J.I. Lindstrom, H. Amano, I. Akasaki, Photoluminescence of GaN: effect of electron irradiation. Appl. Phys. Lett. 73(20), 2968–2970 (1998)
K.H. Chow, G.D. Watkins, A. Usui, M. Mizuta, Detection of interstitial Ga in GaN. Phys. Rev. Lett. 85(13), 2761–2764 (2000)
F.J. Sanchez, D. Basak, M.A. Sanchez-Garcia, E. Calleja, E. Munoz, I. Izpura, F. Calle, J.M.G. Tijero, B. Beaumont, P. Lorenzini, P. Gibart, T.S. Cheng, C.T. Foxon, J.W. Orton, MRS Internet J. Nitride Semicond. Res. 1(7), (1996)
A.Y. Polyakov, N.B. Smirnov, A.S. Usikov, A.V. Govorkov, B.V. Pushniy, Studies of the origin of the yellow luminescence band, the nature of nonradiative recombination and the origin of persistent photoconductivity in n-GaN films. Solid State Electron. 42, 1959 (1998)
M.A. Reschikov, H. Morkoc, Luminescence properties of defects in GaN. J. Appl. Phys. 97, 061301 (2005)
T. Ogino, M. Aoki, J. Appl. Phys. 19, 2395 (1980)
A.Y. Polyakov, N.B. Smirnov, A.V. Govorkov, S.J. Pearton, J.M. Zavada, R.G. Wilson, Proton implantation effects on electrical and luminescent properties of p-GaN. J. Appl. Phys. 94(5), 3069–3074 (2003)
A.Y. Polyakov, N.B. Smirnov, A.V. Govorkov, A.V. Markov, N.G. Kolin, D.I. Merkurisov, V.M. Boiko, K.D. Shcherbatchev, V.T. Bublik, M.I. Voronova, S.J. Pearton, A. Dabiran, A.V. Osinsky, Neutron irradiation effects in p-GaN. J. Vac. Sci. Technol. B. 24(5), 2256–2261 (2006)
A.Y. Polyakov, N.B. Smirnov, A.V. Govorkov, J.M. Redwing, Deep traps in high resistivity AlGaN films. Solid State Electron. 42, 831 (1998)
L.S. Berman, Purity Control of Semiconductors by the Method of Capacitance Spectroscopy (Electronic Integral Systems, St. Petersburg, 1995), p. 180.
P. Hacke, H. Nakayama, T. Detchprom, K. Hiramatsu, N. Sawaki, Deep levels in the upper band-gap region of lightly Mg-doped GaN. Appl. Phys. Lett. 68, 1362 (1996)
G. Popovici, H. Morkoc, Growth and doping of defects in III-nitrides, in GaN and Related Materials II, ed. by S.J. Pearton (Gordon and Breach Science Publishers, the Netherlands, 1999) pp. 93–172 they produce blue band: my review on AlGaN
Z-Q Fang, J.W. Hemsky, D.C. Look, M.P. Mack, Electron-irradiation-induced deep level in GaN. Appl. Phys. Lett. 72(4), 448(1998)
B.R. Gossick, Disordered regions in semiconductors bombarded by fast neutrons. J. Appl. Phys. 30(8), 1214 (1959)
A.Y. Polyakov, N.B. Smirnov, A.V. Govorkov, A.V. Markov, N.G. Kolin, D.I. Merkurisov, V.M. Boiko, K.D. Shcherbatchev, V.T. Bublik, M.I. Voronova, I.-H. Lee, C.R. Lee, Fermi level pinning in heavily neutron irradiated GaN. J. Appl. Phys. 100(9), 093715–093719 (2006)
W. Walukiewicz, J. Vac. Sci. Technol. B5(4), 1062 (1987)
J. Tersoff, J. Vac. Sci. Technol. B4(4), 1066 (1986)
K. Kuriyama, T. Tokumasu, Jun Takahashi, H. Kondo, M. Okada, Lattice distortions and the transmuted-Ge related luminescence in neutron-transmutation-doped GaN. Appl. Phys. Lett. 80 (18), 3328–3330 (2002)
V.N. Brudnyi, A.V. Kosobutskiy, N.G. Kolin, Sov. Phys. Semicond. 43(10), 1312 (2009) (in Russian)
V.V. Emtsev, V.Yu. Davydov, E.E. Haller, A.A. Klochikhin, V.V. Kozlovskii, G.A. Oganesyan, D.S. Poloskin, N.M. Shmidt, V.A. Vekshin, A.S. Usikov, Radiation-induced defects in n-type GaN and InN. Physica B 308–310, 58–61 (2001)
N.M. Shmidt, D.V. Davydov, V.V. Emtsev, I.L. Krestnikov, A.A. Lebedev, W.V. Lundin, D.S. Poloskin, A.V. Sakharov, A.S. Usikov, A.V. Osinsky, Effects of annealing on defects in as-grown and g-ray irradiated n-GaN layers. Phys. Stat. Sol. (b) 216, 533–536 (1999)
B.H. Rose, C.E. Barnes, Proton damage effects on light emitting diodes. J. Appl. Phys. 53, 1772–1780 (1982)
C.A. Usui, H. Sunakawa, A. Sakai, A.A. Yamaguchi, Jpn. J. Appl. Phys. 36, L899 (1997).
In-Hwan Lee, A.Y. Polyakov, N.B. Smirnov, A.V. Govorkov, A.V. Markov, S.J. Pearton, Electrical and recombination properties and deep traps spectra in MOCVD ELOG GaN layers. Phys. Stat. Sol. (c), 3(6), 2087–2090 (2006)
K. Fujito, K. Kiyomi, T. Mochizuki, H. Oota, H. Namita, S. Nagao, I. Fujimura, Phys. Stat. Sol. (a) 205, 1056 (2008)
T. Wosinsky, J. Appl. Phys. 65, 1566 (1988)
Y. Tokuda, Y. Matuoka, K. Yoshida, H. Ueda, O. Ishiguro, N. Soejima, T. Kachi, Evaluation of dislocation-related defects in GaN using deep-level transient spectroscopy. Phys. Stat. Sol. (c) 4(7), 2568–2571 (2007)
A.Y. Polyakov, N.B. Smirnov, A.V. Govorkov, A.V. Markov, T.G. Yugova, C.R. Lee, I-H. Lee, N.G. Kolin, I.D. Merkurisov, V.M. Boiko, K.D. Scherbatchev, V.T. Bublik, M.I. Voronova, S.J. Pearton, Neutron irradiation effects on GaN films prepared by lateral overgrowth, Abstracts of the European Workshop on III-Nitride Semiconductor Materials, Heraklion, Crete, Greece, September 2006 (Heraklion University, Heraklion, 2006), pp. 91–92
A.Y. Polyakov, Structural and electronic properties of AlGaN, in GaN and Related Materials II, ed. by S. Pearton (Gordon and Breach, New York, 1999), pp. 173–233
L. Chernyak, A. Osinsky, G. Nootz, A. Schulye, J. Jasinski, M. Benamara, Z. Liliental-Weber, D.C. Look, R.J. Molnar, Appl. Phys. Lett. 77, 2695 (2000)
E.B. Yakimov, P.S. Vergeles, A.Y. Polyakov, N.B. Smirnov, A.V. Govorkov, In-Hwan Lee, Cheul Ro Lee, S.J. Pearton, Spatial variations of doping and lifetime in epitaxial laterally overgrown GaN. Appl. Phys. Lett. 90, 152114 (2007)
E.B. Yakimov, P.S. Vergeles, A.Y. Polyakov, N.B. Smirnov, A.V. Govorkov, In-Hwan Lee, Cheul Ro Lee, S.J. Pearton, Donor doping non-uniformity in undoped and Si doped n-GaN prepared by epitaxial lateral overgrowth. Appl. Phys. Lett. 94(4), 042118-1–042118-3 (2008)
A.Y. Polyakov, N.B. Smirnov, A.V. Govorkov, A.V. Markov, E.B. Yakimov, P.S. Vergeles, n-Hwan Lee, Cheul Ro Lee, S.J. Pearton, Effects of changing the thickness of laterally overgrown n-GaN on deep traps spectra. J. Vac. Sci. Technol. (B). 26(3), 990–994 (2008)
A.Y. Polyakov, N.B. Smirnov, A.V. Govorkov, A.V. Markov, E.B. Yakimov, P.S. Vergeles, N.G. Kolin, D.I. Merkurisov, V.M. Boiko, In-H. Lee, C.-R. Lee, S.J. Pearton, Neutron radiation effects in epitaxially laterally overgrown GaN films. J. Electron. Mater. 36(10), 1320–1325 (2007)
S.J. Pearton, GaN device processing, in GaN and Related Materials, ed. by S.J. Pearton (Gordon and Breach, New York, 1999), pp. 475–540
J.W. Ager, R.E. Jones, D.M. Yamaguchi, K.M. Yu, W. Walukiewicz, S.W. Li, E.E. Haller, H. Lu, W.J. Schaff, Phys. Stat. Sol. (b). 244, 1820 (2007)
A.Y. Polyakov, N.B. Smirnov, A.V. Govorkov, N.V. Pashkova, S.J. Pearton, J.M. Zavada, R.G. Wilson, Proton implantation effects on electrical and optical properties of undoped AlGaN with high Al mole fraction. J. Vac. Sci. Technol. B21(6), 2500–2505 (2004)
A.Y. Polyakov, N.B. Smirnov, A.V. Govorkov, A.V. Markov, N.G. Kolin, V.M. Boiko, D.I. Merkurisov, S.J. Pearton, Neutron irradiation effects in undoped n-AlGaN. J. Vac. Sci. Technol. B24(3), 1094–1097 (2006)
A.Y. Polyakov, N.B. Smirnov, A.V. Govorkov, K.H. Baik, S.J. Pearton, J.M. Zavada, Changes in electrical and optical properties of p-AlGaN due to proton implantation. J. Vac. Sci. Technol. B22(5), 2291–2294 (2004)
B.D. White, M. Bataiev, S.H. Gross, X. Hu, A. Karmarkar, D.M. Fleetwood, R.D. Schrimpf, W.J. Schaff, L.J. Brillson, Electrical, spectral and chemical properties of 1.8 MeV proton irradiated AlGaN/GaN HEMT structures. IEEE Trans. Nucl. Sci. 50(6) 1934 (2003)
X. Hu, A. Karmarkar, B. Jun, D.M. Fleetwood, R.D. Schrimpf, R.D. Geil, R.A. Weller, B.D. White, M. Bataiev, L.J. Brillson, U.K. Mishra, Proton irradiation effects in AlGaN/AlN/GaN high electron mobility transistors, IEEE Trans. Nucl. Sci. 50(6) 1791 (2003)
M.S. Shur, M.A. Khan, in GaN and Related Materials II, ed. by S.J. Pearton (Gordon and Breach Science, New York, 1999) pp.47–92
H. Miyamoto, Phys. Stat. Sol. (c). 3, 2254 (2006)
F. Gaudreau, P. Fournier, C. Carlone, S.M. Khanna, H. Tang, J. Webb, A. Houdayer, Transport properties of proton irradiated gallium nitride-based two-dimensional electron-gas system. IEEE Trans. Nucl. Sci. 49(6), 2702 (2002)
A.Y. Polyakov, N.B. Smirnov, A.V. Govorkov, A.V. Markov, S.J. Pearton, N.G. Kolin, D.I. Merkurisov, V.M. Boiko, Neutron irradiation effects on electrical properties and deep level spectra in undoped n-AlGaN/GaN heterostructures. J. Appl. Phys. 98, 033529-1–033529-6 (2005)
A.Y. Polyakov, N.B. Smirnov, A.V. Govorkov, A.V. Markov, S.J. Pearton, A.M. Dabiran, A.M. Wowchak, B. Cui, A.V. Osinsky, P.P. Chow, N.G. Kolin, V.M. Boiko, D.I. Merkurisov, Electron irradiation of AlGaN/GaN and AlN/GaN heterojunctions. Appl. Phys. Lett. 93, 152101 (2008)
A.Y. Polyakov, N.B. Smirnov, A.V. Govorkov, A.V. Markov, A.M. Dabiran, A. M. Wowchak, B. Cui, A.V. Osinski, P.P. Chow, S.J. Pearton,Electrical properties and deep traps spectra in AlN/GaN and AlGaN/GaN heterojunctions, J. Appl. Phys. 104, 053702 (2008)
X. Hu, B.X. Choi, H.J. Barnaby, D.M. Fleetwood, R.D. Schrimpf, S. Lee, S. Shojah-Ardalan, R. Wilkins, U. Mishra, R.W. Dettmer, The energy dependence of proton induced degradation in AlGaN/GaN HEMTs IEEE Trans. Nucl. Sci. 51(2), 293 (2004)
A. Rashmi, S. Kranti, S. Haldar, P.S. Gupta, Impact of strain relaxation of AlGaN layer on 2-DEG sheet charge density and current-voltage characteristics of lattice mismatched AlGaN/GaN HEMTs. Microelectron. J. 33(3), 205 (2002)
A.Y. Polyakov, N.B. Smirnov, A.V. Govorkov, N.G. Kolin, V.M. Boiko, D.I. Merkurisov, S.J. Pearton, Effects of electron irradiation on GaN-based transistor structures, in the extended abstracts of the 6th Russian Conference “Nitrides of gallium, indium and aluminum: structures and devices, S-Petersburg, Ioffe Physico-Technical Institute, 2008
B. Luo, J.W. Johnson, F. Ren, K.K. Alums, C.R. Abernathy, S.J. Pearton, A.M. Dabiran, A.M. Wowchak, C.J. Polley, P.P. Chow, D. Shoenfeld, A.G. Baca, Influence of 60Co γ-rays on dc performance of AlGaN/GaN high electron mobility transistors. Appl. Phys. Lett. 80(4), 604 (2002)
A.Y. Polyakov, N.B. Smirnov, A.V. Govorkov, In-H. Lee, J.H. Baek, N.G. Kolin, V.M. Boiko, D.I. Merkurisov, S.J. Pearton, Electron irradiation effects in GaN/InGaN multiple quantum well structures. J. Electrochem. Soc. 155(1), H31–H35 (2008)
A.P. Karmarkar, B. Jun, D.M. Fleetwood, D.D. Schrimpf, R.A. Weller, B.D. White, L.S. Brillson, U.K. Mishra, Proton irradiation effects on GaN-based high electron mobility transistors with Si-doped AlGaN and thick GaN cap layers. IEEE Trans. Nucl. Sci. 51(6), 3801 (2004)
S.J. Cai, J.S. Tang, R. Li, J. Wei, L. Wong, J.L. Chen, K.L. Wang, M. Chen, Y.F. Zhao, R.D. Schrimpf, J.C. Keay, K.F. Galloway, Annealing behavior of proton irradiated AlGaN/GaN high electron mobility transistors grown by MBE. IEEE Trans. Electron. Dev. 47, 304 (2000)
Q. Wang, H.Q. Xu, P. Omling, C. Jang, G. Malmqvist, Transistor properties of proton-irradiated GaAs/AlGaAs two-dimensional electron gas structures. Nucl. Instrum. Methods Phys. Res. B 160, 33 (2000)
B. Luo, J.W. Johnson, F. Ren, K.K. Allums, C.R. Abernathy, S.J. Pearton, R. Dwidevi, T.N. Fogarty, R. Wilkins, A.M. Dabiran, A.M. Wowchak, C.J. Polley, P.P. Chow, A.G. Baca, DC and RF performance of proton-irradiated AlGaN/GaN high electron mobility transistors, Appl. Phys. Lett. 79(14), 2196 (2001)
B. Luo, J. Kim, F. Ren, J.K. Gillespie, R.C. Fitch, J. Sewell, R. Dettmer, G.D. Via, A. Crespo, T.J. Jenkins, B.P. Gila, A.H. Onstine, K.K. Allums, C.R. Abernathy, S.J. Pearton, R. Dwidevi, T.N. Fogarty, R. Wilkins, Electrical characteristics of proton-irradiated Sc2O3 passivated AlGaN/GaN high electron mobility transistors. Appl. Phys. Lett. 82(9), 1428 (2003)
B. Luo, F. Ren, K.K. Allums, B.P. Gila, A.H. Onstine, C.R. Abernathy, S.J. Pearton, R. Dwivedi, T.N. Fogarty, R. Wilkins, R.C. Fitch, J.K. Gillespie, T.J. Jenkins, R. Dettmer, J. Sewell, G.D. Via, A. Crespo, A.G. Baca, R.J. Shul, Proton irradiation of MgO or Sc2O3 passivated high electron mobility transistors. Solid-State Electron. 47, 1015 (2003)
B. Luo, J.M. Johnson, F. Ren, K.K. Allums, C.R. Abernathy, S.J. Pearton, A.M. Dabiran, A.M. Wowchak, C.J. Polley, P.P. Chow, D. Schoenfeld, A.G. Baca, Influence of 60Co g-rays on dc performance of AlGaN/GaN high electron mobility transistors. Appl. Phys. Lett. 80(4), 604 (2002)
V. Tilak, B. Green, V. Kaper, H. Kim, T. Prunty, J. Smart, J. Shealy, L.F. Eastman, IEEE Electron Dev. Lett. 22(11), 504 (2001)
I. Daumiller, D. Theron, C. Gaquiere, A. Vescan, R. Dietrich, A. Wieszt, H. Leier, R. Vetury, U. K. Mishra, I. P. Smorchkova, S. Keller, C. Nguyen, E. Kohn, IEEE Electron. Dev. Lett. 22, 62 (2001)
U.K. Mishra, P. Parikh, Y.-F. Wu, Proc.IEEE 90, 1022 (2002).
C. Lee, H. Wang, J. Yang, L. Witkowski, M. Muir, M. Asif Khan, P. Saunier, Electron. Lett. 38, 924 (2002).
O. Mitrofanov, M. Manfra, N.G. Weimann, Appl.Phys.Lett. 82, 4361 (2003).
S.C. Binari, K. Ikossi, J.A. Roussos, W. Kruppa, D. Park, H.B. Dietrich, D.D. Koleske, A.E. Wickenden, and R.L. Henry, IEEE Trans. Electron. Dev. 48, 465 (2001)
B.M. Green, K.K. Chu, E.M. Chumbes, J.A. Smart, J.R. Shealy, L.F. Eastman, IEEE Electron. Dev. Lett. 21, 268 (2000)
L.F. Eastman, V. Tilak, J. Smart, B.M. Green, E.M. Chumbes, R. Dimitrov, H. Kim; O.S. Ambacher, N. Weimann, T. Prunty, M. Murphy, W.J. Schaff, J.R. Shealy, IEEE Trans. Electron Dev. 48, 479 (2001)
X. Hu, A. Koudymov, G. Simin, J. Yang, M. Asif Khan, A. Tarakji, M.S. Shur, R. Gaska, Appl. Phys. Lett. 79, 2832 (2001).
B. Luo, J.W. Johnson, J. Kim, R.M. Mehandru, F. Ren, B.P. Gila, A.H. Onstine, C.R. Abernathy, S.J. Pearton, A.G. Baca, R.D. Briggs, R.J. Shul, C. Monier, J. Han, Appl. Phys. Lett. 80, 1661 (2002)
A.Y. Polyakov, N.B. Smirnov, A.V. Govorkov, V.N. Danilin, T.A. Zhukova, B. Luo, F. Ren, B.P. Gila, A.H. Onstine, C.R. Abernathy, S.J. Pearton, Deep traps in unpassivated and Sc2O3 passivated AlGaN/GaN high electron mobility transistors. Appl. Phys. Lett. 83(13), 2608–2610 (2003)
A.Y. Polyakov, N.B. Smirnov, B.P. Gila, M. Hlad, A.P. Gerger, C.R. Abernathy, S.J. Pearton, Studies of interface states in Sc2O3/GaN, MgO/GaN and MgScO/GaN structures. J. Electrochem. Soc. 154(2), H115–H118 (2007)
S.M. Khanna, D. Estan, A. Houdayer, H. C. Liu, R. Dudek, Proton radiation damage at low temperature in GaAs and GaN light emitting diodes. IEEE Trans. Nucl. Sci. 51(6), 3585–3594 (2004)
F Gaudraeau, C. Cardone, A. Noudayer, S.M. Khamna, Spectral properties of proton irradiated GaN blue diodes. IEEE Trans. Nucl. Sci. 48, 1778–1784 (2001)
M. Osinsky, P. Perlin, H. Schone, A.H. Paxtone, E.W. Taylor, Effects of proton irradiation on AlGaN/InGaN/GaN green light emitting diodes. Electron. Lett. 33, 1252–1254 (1997)
J. Grant, W. Cunningham, A. Blue, V. O’Shea, J. Vaitkus, E. Gaubas, M. Rahman, Nucl. Instr. Meth. Phys. Res. A. 546, 213 (2005)
J. Grant, R. Bates, W. Cunningham, A. Blue, J. Melone, F. McEwan, J. Vaitkus, E. Gaubas, V. O’Shea, Nucl. Instr. Meth. Phys. Res. A 576, 60 (2007)
A.Y. Polyakov, N.B. Smirnov, A.V. Govorkov, A.V. Markov, E.A. Kozhukhova, I.M. Gazizov, N.G. Kolin, D.I. Merkurisov, V.M. Boiko, A.V. Korulin, V.M. Zalyetin, S.J. Pearton, I.-H. Lee, A.M. Dabiran, P.P. Chow, Alpha particle detection with GaN Schottky diodes. J. Appl. Phys. 106(10), 103708 (2009)
R.G. Wilson, S.J. Pearton, C.R. Abernathy, J.M. Zavada, Thermal stability of implanted dopants in GaN. Appl. Phys. Lett. 66(17), 2238 (1995)
S.J. Pearton, C.B. Vartuli, J.C. Zolper, C. Yuan, R.A. Stall, Appl. Phys. Lett. 67, 1435 (1995)
C.R. Abernathy, J.D. Mackenzie, S.J. Pearton, W.S. Hobson, Appl. Phys. Lett. 66, 1969 (1995)
S.O. Kucheyev, M. Toth, M.R. Phillips, J.S. Williams, C. Jagadish, G. Li, Appl. Phys. Lett. 78, 34 (2001)
A.Y. Polyakov, M. Shin, R.G. Wilson, M. Skowronski, D.W. Greve, S.J. Pearton, Ion implantation of Si, Mg and C into AlGaN. Solid-State Electron. 41, 703 (1997)
K.A. Jones, C. Nguyen, M.A. Derenge, I. Batyrev, T.S. Zheleva, Electrical activation processes in Si and Mg implanted GaN”in the abstracts of the 8th International Conference on Nitride Semiconductors, October 18–23, 2009, Jeju Island, Korea, paper ThP37, p.1160
B.G. Svensson, A. Hallien, J. Wong-Leung, M.S. Janson, M.K. Linnarsson, A.Yu. Kuznetsov, G. Alfieri, U. Grossner, E.V. Monakhov, H.K. Nielsen, C. Jagadish, J. Grillenberger, Ion implantation processing and related effects in SiC. Mat. Sci. Forum. 527–529, 781–786 (2006)
S.J. Pearton, C.R. Abernathy, P.W. Wisk, W.S. Hobson, F. Ren, Appl. Phys. Lett. 63, 2238 (1993)
J.C. Zolper, S.J. Pearton, C.R. Abernathy, C.B. Vartuli, Appl. Phys. Lett. 66, 3042 (1995)
S.C. Binari, L.B. Rowland, W. Kruppa, H.B. Dietric, K. Doverspike, D.K. Gaskill, Electron. Lett. 30, 1248 (1994)
S.M. Hearne, D.N. Jaimeson, C. Yang, S. Prawer, J. Salzman, O. Katz, Electrical characteristics of proton irradiated AlGaN devices. Nucl. Instrum. Methods. Phys. Res. B 190, 873–877 (2002)
M. Lambsdorf, J. Kohl, J. Rosenzweig, A. Axmann, J. Schneider, Appl. Phys. Lett. 58, 1881 (1991)
V.M. Rao, W.-P. Hong, C. Caneau, G.K. Chang, N. Papanicolau, H.B. Dietrich, J. Appl. Phys. 70, 3943 (1991)
R. Wang, Y. Cai, W.C.W. Tang, K. M. Lau, K. J. Chen, Intergration of enhancement and depletion mode AlGaN/GaN MIS-HFET by fluoride-based plasma treatment. Phys. Stat. Sol. (a) 204(6) 2024–2027 (2007)
Acknowledgements
I would like to thank my long time colleagues with whom I have been working on radiation effects in III-nitrides, Prof. S.J. Pearton of the University of Florida, Prof. In-Hwan Lee of Chonbuk University in Korea, Dr. Amir Dabiran at SVT Technologies, Dr. Nikolai Smirnov and Dr. Anatoliy Govorkov at the Institute of Rare Metals, Dr. Nikolai Kolin at the Institute of Physical Chemistry in Obninsk for their help, support, and fruitful discussions. Also, useful discussions with Dr. D. C. Look and Dr. Z-Q. Fang at Wright State University are gratefully acknowledged. The work was supported in part by International Science and Technology Center ISTC grant #3870.
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Polyakov, A.Y. (2012). Radiation Effects in GaN. In: Pearton, S. (eds) GaN and ZnO-based Materials and Devices. Springer Series in Materials Science, vol 156. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-23521-4_9
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