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Raman Spectroscopy of Compound Semiconductors

  • Jordi Ibáñez
  • Ramon Cuscó
Chapter
Part of the Springer Series in Materials Science book series (SSMATERIALS, volume 150)

Abstract

Raman spectroscopy has become a widely used characterization tool in today’s semiconductor research. In this chapter, we provide an introductory background to the physics of Raman scattering and discuss present-day applications of Raman spectroscopy in the field of compound semiconductor physics. Illustrative examples of Raman studies are given on a variety of topics such as crystal quality assessment, strain determination, alloy composition, impurities, and free-charge characterization in doped semiconductors.

Keywords

Raman Spectrum Raman Spectroscopy Impurity Mode Longitudinal Optical Transverse Optical 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 2012

Authors and Affiliations

  1. 1.Institut Jaume Almera, Consell Superior d’Investigacions Científiques (CSIC)Lluís Solé i Sabarís s/nBarcelona, CataloniaSpain

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