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Pressure Studies

  • Andrew Prins
  • Alf Adams
  • Stephen Sweeney
Chapter
Part of the Springer Series in Materials Science book series (SSMATERIALS, volume 150)

Abstract

High pressure is one of the most valuable characterization tools available in semiconductor research. In this chapter, we show how it has been used directly to measure some of the fundamental properties of materials and also to investigate electronic and optoelectronic devices, resulting in improved theoretical models of material properties and optimized device performance. We hope that the examples we give and the experimental methods we describe will inspire others to use this powerful but underused research technique.

Keywords

Threshold Current Deep Level Transient Spectroscopy Electronic Band Structure Quantum Cascade Laser Auger Recombination 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Notes

Acknowledgements

The authors would like to thank I.P. Marko and S.R. Jin for their contributions to this chapter and would also like to thank the Engineering and Physical Sciences Research Council (EPSRC) for their support of high pressure activities at the University of Surrey.

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Copyright information

© Springer-Verlag Berlin Heidelberg 2012

Authors and Affiliations

  1. 1.Advanced Technology InstituteUniversity of SurreySurreyUK

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