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Removal of Surface Artifacts of Material Volume Data with Defects

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Computational Science and Its Applications - ICCSA 2011 (ICCSA 2011)

Part of the book series: Lecture Notes in Computer Science ((LNTCS,volume 6783))

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Abstract

The three-dimensional defect distribution in material test specimens is a very important piece of information for us to understand the deformation and failure mechanism of materials. This distribution is sometimes complicated by the surface roughness of specimens in the defect detection of computed tomography data. In this paper, we proposed a new local differentiation algorithm to remove the surface artifacts caused by surface roughness in the defect detection of material specimens from computed tomography (CT) volume data. The accuracy of our method is compared with a traditional scan-line algorithm in terms of defect volume fraction measured in an independent scanning electron microscope (SEM) test. The experimental result indicates that our method is significantly better than the existing scan-line approach for predicting the defect volume fraction.

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Authors and Affiliations

  1. Dept. of Computer & Information Science, the University of Michigan, 4901 Evergreen Road, Dearborn, Michigan, U.S.A., 48128

    Jie Shen, Vela Diego & David Yoon

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  1. Jie Shen
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  2. Vela Diego
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  3. David Yoon
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Editor information

Editors and Affiliations

  1. Basilicata University Potenza, L.I.S.U.T. - D.A.P.I.T., 10, Viale dell’Ateneo Lucano, 85100, Potenza, Italy

    Beniamino Murgante

  2. Department of Mathematics and Computer Science, University of Perugia, Via Vanvitelli, 1, 06123, Perugia, Italy

    Osvaldo Gervasi

  3. Department of Applied Mathematics and Computational Sciences, University of Cantabria,, Avda. de los Castros, s/n, Santander, C.P. 39005, Spain

    Andrés Iglesias

  4. School of Business Systems, Monash University, VIC 3800, Clayton, Australia

    David Taniar

  5. Department of Intelligent Informatics, Kyushu Sangyo University, 2-3-1 Matsukadai, 813-8503, Higashi-ku, Fukuoka, Japan

    Bernady O. Apduhan

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Shen, J., Diego, V., Yoon, D. (2011). Removal of Surface Artifacts of Material Volume Data with Defects. In: Murgante, B., Gervasi, O., Iglesias, A., Taniar, D., Apduhan, B.O. (eds) Computational Science and Its Applications - ICCSA 2011. ICCSA 2011. Lecture Notes in Computer Science, vol 6783. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-21887-3_47

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  • DOI: https://doi.org/10.1007/978-3-642-21887-3_47

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-21886-6

  • Online ISBN: 978-3-642-21887-3

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