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Raman Spectroscopy for Characterization of Semiconducting Nanowires

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Raman Spectroscopy for Nanomaterials Characterization

Abstract

Raman scattering behavior germane to semiconductor nanowires (NWs) and the application of Raman spectroscopy to characterize the structure, composition, strain, and temperature of individual semiconductor nanowires with submicron resolution are discussed.

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Author information

Authors and Affiliations

  1. IBM Almaden Research Center, 650 Harry Road, San Jose, CA, 95120-6099, USA

    Gregory S. Doerk

  2. Department of Chemical and Biomolecular Engineering, University of California, 201 Gilman Hall, Berkeley, CA, 94720, USA

    Dr. Carlo Carraro & Prof. Roya Maboudian

Authors
  1. Gregory S. Doerk
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  2. Dr. Carlo Carraro
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  3. Prof. Roya Maboudian
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Editor information

Editors and Affiliations

  1. Center for Advanced Microstructures and Devices, Baton Rouge, LA, USA

    Challa S. S. R. Kumar

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Doerk, G.S., Carraro, C., Maboudian, R. (2012). Raman Spectroscopy for Characterization of Semiconducting Nanowires. In: Kumar, C.S.S.R. (eds) Raman Spectroscopy for Nanomaterials Characterization. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-20620-7_17

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