Abstract
Nanorobotics means literally the study of robots that are nanoscale in typical size, i.e. nanorobots,which have yet to be realized. Generally, nanorobots are large robots capable of manipulation nanoscale objects with nanometer resolution, e.g. a AFMbased nanorobotic manipulation system and a scanning electron microscope (SEM) equipped with a nanomanipulator.When studying nanorobotics, we first have to understand physics that underlies interactions at the nanoscale. At microscale, some basic micromanipulation problems attributed to the scale affects have been identified. We have seen how the surface effects, instead of volume effects, dominate the physical phenomena at this scale. Most of these scaling laws are still available at the nanoscale. However, the scale affects become more severe at the nanoscale due to the additional three orders of magnitude in size reduction, and it becomes much more difficult to predict and control because of more scale effects and uncertainties introduced when the nanomanipulation performed in the nanoworld.
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References
Eigler, D.M., Schweizer, E.K.: Positioning single atoms with a scanning tunneling microscope. Nature 344, 524–526 (1990)
Fukuda, T., Arai, F., Dong, L.X.: Assembly of nanodevices with carbon nanotubes through nanorobotic manipulations. Proc. IEEE 91, 1803–1818 (2003)
Dong, L.X., Arai, F., Fukuda, T.: Electron-beam-induced deposition with carbon nanotube emitters. Appl. Phys. Lett. 81, 1919–1921 (2002)
Dong, L.X., Arai, F., Fukuda, T.: Destructive constructions of nanostructures with carbon nanotubes through nanorobotic manipulation. IEEE/ASME Trans. Mechatronics 9, 350–357 (2004)
Fahlbuscha, S., Mazerolleb, S., Breguetb, J.-M., Steineckerc, A., Agnusd, J., Pérezd, R., Michlera, J.: Nanomanipulation in a scanning electron microscope. J. Materials Processing Technology 167(2-3), 371–382 (2005)
Molhave, K., Wich, T., Kortschack, A., Boggild, P.: Pick-and-place nanomanipulation using microfabricated grippers. Nanotechnology 17, 2434–2441 (2006)
Nakajima, M., Arai, F., Fukuda, T.: In situ measurement of Young’s modulus of carbon nanotubes inside a TEM through a hybrid nanorobotic manipulation system. IEEE/ASME Trans. Nanotechnology 5, 243–248 (2006)
Dong, L.X., Tao, X.Y., Zhang, L., Nelson, B.J., Zhang, X.B.: Nanorobotic spot welding: controlled metal deposition with attogram precision from copper-filled carbon nanotubes. Nano Lett. 7, 58–63 (2007)
Andersen, K.N., Petersen, D.H., Carlson, K., Molhave, K., Sardan, O., Horsewell, A., Eichhorn, V., Fatikow, S., Boggild, P.: Multimodal Electrothermal Silicon Microgrippers for Nanotube Manipulation. IEEE/ASME Trans. Nanotechnology 8, 76–85 (2009)
Leach, J., Sinclair, G., Jordan, P., Courtial, J., Padgett, M.J., Cooper, J., Laczik, Z.J.: 3D manipulation of particles into crystal structures using holographic optical tweezers. Opt. Express 12, 220–226 (2004)
de Vries Anthony, H.B., Krenn, B.E., van Driel, R., Kanger, J.S.: Micro Magnetic Tweezers for Nanomanipulation Inside Live Cells. Biophysical Journal 88, 2137–2144 (2005)
Martin, M., Roschier, L., Hakonen, P., Parts, Ü., Paalanen, M., Schleicher, B., Kauppinen, E.I.: Manipulation of Ag nanoparticles utilizing noncontact atomic force microscopy. Appl. Phys. Lett. 73, 1505–1507 (1998)
Sitti, M., Hashimoto, H.: Controlled pushing of nanoparticles: modeling and experiments. IEEE/ASME Trans. Mechatron. 5(2), 199–211 (2000)
Resch, R., Lewis, D., Meltzer, S., Montoya, N., Koel, B.E., Madhukar, A., Requicha, A.A.G., Will, P.: Manipulation of gold nanoparticles in liquid environments using scanning force microscopy. Ultramicroscopy 82, 135–139 (2000)
Albrecht, P.M., Lyding, J.W.: Lateral manipulation of single-walled carbon nanotubes on H-passivated Si(100) surfaces with an ultra-highvacuum scanning tunneling microscope. Small 3, 146–152 (2007)
Tranvouez, E., Orieux, A., Boer-Duchemin, E., Devillers, C.H., Huc, V., Comtet, G., Dujardin, G.: Manipulation of cadmium selenide nanorods with an atomic force microscope. Nanotechnology 20, 165304 (2009)
Sitti, M.: Atomic force microscope probe based controlled pushing for nanotribological characterization. IEEE/ASME Trans. Mechatron. 9, 343–349 (2004)
Palacio, M., Bhushan, B.: A nanoscale friction investigation during the manipulation of nanoparticles in controlled environments. Nanotechnology 19, 315710 (2008)
Dietzel, D., Monninghoff, T., Jansen, L., Fuchs, H., Ritter, C., Schwarz, U.D., Schirmeisen, A.: Interfacial friction obtained by lateral manipulation of nanoparticles using atomic force microscopy techniques. J. Appl. Phys. 102, 084306 (2007)
Conache, G., Gray, S.M., Ribayrol, A., Fröberg, L.E., Samuelson, L., Pettersson, H., Montelius, L.: Friction measurements of inAs nanowires on silicon nitride by AFM manipulation. Small 5, 203–207 (2009)
Dietzel, D., Monninghoff, T., Jansen, L., Fuchs, H., Ritter, C., Schwarz, U.D., Schirmeisen, A.: Interfacial friction obtained by lateral manipulation of nanoparticles using atomic force microscopy techniques. J. Appl. Phys. 102, 084306 (2007)
Xu, B., Tao, N.J.: Measurement of single-molecule resistance by repeated formation of molecular junctions. Science 301, 1221–1223 (2003)
Grill, L., Rieder, K., Moresco, F., Stojkovic, S., Gourdon, A., Joachim, C.: Exploring the interatomic forces between tip and single molecules during STM manipulation. Nano Lett. 6, 2685–2689 (2006)
Mougin, K., Gnecco, E., Rao, A., Cuberes, M.T., Jayaraman, S., McFarland, E.W., Haidara, H., Meyer, E.: Manipulation of gold nanoparticles: influence of surface chemistry, temperature, and environment (vacuum versus ambient atmosphere). Langmuir. 24, 1577–1581 (2008)
Whittaker, J.D., Minot, E.D., Tanenbaum, D.M., McEuen, P.L., Davis, R.C.: Measurement of the adhesion force between carbon Nanotubes and a silicon dioxide substrate. Nano Lett. 6, 953–957 (2006)
Li, X., Gao, H., Murphy, C.J., Caswell, K.K.: Nanoindentation of silver sanowires. Nano Lett. 3, 1495–1498 (2003)
Bordag, M., Ribayrol, A., Conache, G., Fröberg, L.E., Gray, S., Samuelson, L., Montelius, L., Pettersson, H.: Shear Stress measurements on InAs nanowires by AFM manipulation. Small 3, 1398–1401 (2007)
Wu, B., Heidelberg, A., Boland, J.J.: Mechanical properties of ultrahigh-strength gold nanowires. Nature Materials 4, 525–529 (2005)
Ni, H., Li, X.D.: Youngs modulus of ZnO nanobelts measured using atomic force microscopy and nanoindentation techniques. Nanotechnology 17, 3591–3597 (2006)
Brown, K.A., Aguilar, J.A., Westervelt, R.M.: Coaxial atomic force microscope tweezers. Appl. Phys. Lett. 96, 123109 (2010)
Toset, J., Gomila, G.: Three-dimensional manipulation of gold nanoparticles with electro-enhanced capillary forces. Appl. Phys. Lett. 96, 043117 (2010)
Xie, H., Haliyo, D.S., Régnier, S.: A versatile atomic force microscope for three-dimensional nanomanipulation and nanoassembly. Nanotechnology 20, 215301 (2009)
Sitti, M., Hashimoto, H.: Teleoperated touch feedback from the surfaces at the nanoscale: Modeling and experiments. IEEE/ASME Trans. Mechatron. 8, 287–298 (2003)
Li, G.Y., Xi, N., Yu, M.M., Fung, W.K.: Development of augmented reality system for afm-based nanomanipulation. IEEE/ASME Trans. Mechatron. 9, 358–365 (2004)
Li, G.Y., Xi, N., Chen, H.P., Pomeroy, C., Prokos, M.: ’Videolized’ atomic force microscopy for interactive nanomanipulation and nanoassembly. IEEE Trans. Nanotechnol. 4, 605–615 (2005)
Vogl, W., Ma, B.K.-L., Sitti, M.: Augmented reality user interface for an atomic force microscope based nanorobotic system. IEEE Trans. Nanotechnol. 5, 397–406 (2006)
Kim, S.G., Sitti, M.: Task-based and stable telenanomanipulation in a nanoscale virtual environment. IEEE Trans. Autom. Sci. Eng. 3(3), 240–247 (2006)
Mokaberi, B., Requicha, A.A.G.: Drift compensation for automatic nanomanipulation with scanning probe microscopes. IEEE Trans. Autom. Sci. Eng. 3, 199–207 (2006)
Mokaberi, B., Requicha, A.A.G.: Compensation of scanner creep and hysteresis for AFM nanomanipulation. IEEE Trans. Autom. Sci. Eng. 5, 197–206 (2008)
Xie, H., Haliyo, D.S., Régnier, S.: Characterizing piezoscanner hysteresis and creep using optical levers and a reference nanopositioning stage. Rev. Sci. Instrum. 80, 046102 (2009)
Krohs, F., Onal, C., Sitti, M., Fatikow, S.: Towards Automated Nanoassembly With the Atomic Force Microscope: A Versatile Drift Compensation Procedure. J. Dyn. Sys. Meas. Control 131, 061106 (2009)
Ermakov, A.V., Gatfunkel, E.L.: A novel AFM/STM/SEM system. Rev. Sci. Instrum. 65, 2853–2854 (1994)
Thomas, Ch., Heiderhoff, R., Balk, L.J.: Acoustic near-field conditions in an ESEM/AFM hybrid system. J. Physics: Conference Series 61, 1180–1185 (2007)
Sitti, M.: Teleoperated 2-D micro/nanomanipulation using an atomic force microscope. PhD Thesis, University of Tokyo, Japan (1999), http://www.cs.cmu.edu/msitti/pub.html
Ando, T., Uchihashi, T., Fukuma, T.: High-speed atomic force microscopy for nano-visualization of dynamic biomolecular processes. Progress in Surface Science 83, 337–437 (2008)
Kim, S., Ratchford, D.C., Li, X.: Atomic force microscope nanomanipulation with simultaneous visual guidance. ACS Nano 3, 2989–2994 (2009)
Ettiger, P., Despont, M., Drechsler, U., Durig, U., Haberle, W., Lutwyche, M.I., Rothuizen, H.E., Stutz, R., Widmer, R., Binnig, G.K.: The ‘Millipede’–More than thousand tips for future AFM storage. IBM J. Research and Development 44, 323–340 (2000)
Xie, H., Régnier, S.: High-efficiency automated nanomanipulation with parallel imaging/manipulation force microscopy. IEEE Trans. Nanotechnol. doi:10.1109/TNANO.2010.2041359
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Xie, H., Onal, C., Régnier, S., Sitti, M. (2011). Descriptions and Challenges of AFM Based Nanorobotic Systems. In: Atomic Force Microscopy Based Nanorobotics. Springer Tracts in Advanced Robotics, vol 71. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-20329-9_2
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DOI: https://doi.org/10.1007/978-3-642-20329-9_2
Publisher Name: Springer, Berlin, Heidelberg
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