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High Resolution and High Spatial Resolution of Analytical Electron Microscopy

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Characterization of Microstructures by Analytical Electron Microscopy (AEM)

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Abstract

This chapter presents the high resolution and high spatial resolution of AEM, including HRTEM, CBED, EDS and EELS. Three kinds of advanced AEMs are briefly introduced, and they are negative C s imaging technique, atomic resolution Z-contrast imaging technique and electron holography, respectively.

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Authors and Affiliations

  1. School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai, 200240, P. R. China

    Prof. Yonghua Rong

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  1. Prof. Yonghua Rong
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© 2012 Higher Education Press, Beijing and Springer-Verlag Berlin Heidelberg

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Rong, Y. (2012). High Resolution and High Spatial Resolution of Analytical Electron Microscopy. In: Characterization of Microstructures by Analytical Electron Microscopy (AEM). Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-20119-6_6

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  • DOI: https://doi.org/10.1007/978-3-642-20119-6_6

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-20118-9

  • Online ISBN: 978-3-642-20119-6

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