Abstract
In this chapter the ways how to use mathematics methods to deal with issues on electron diffraction and crystallography are described. These issues include the prediction of an arbitrary zone of diffraction pattern based on the known orientation relationship (OR), prediction of the possible ORs and crystallographic features according to the crystal structure and lattice parameters of the parent phase and precipitate phase, determination of characteristics parameters of coincidence site lattice, the systematic extinction caused by crystal symmetry, etc. In these mathematics analyses, matrix analysis is widely used, and it includes transformation matrices of basis vectors, indices of direction and plane between two phases or in different coordinate systems. In theoretical prediction of ORs, three methods are introduced in detail, and they are edge-to-edge matching model, invariant line strain model, O-line model. In order to understand the systematic extinction in electron diffraction caused by crystallographic symmetries, firstly basic knowledges of crystallography are briefly introduced, such as macro-symmetry elements and their combination laws, point groups, space groups, equivalent positions (equipoints), two dimensional lattice, plane point groups and plane groups; then the relationship between the systematic extinction and the symmetry elements are analyzed, and finally an example of determining crystal structure by extinction features is given.
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Rong, Y. (2012). Mathematics Analysis in Electron Diffraction and Crystallography. In: Characterization of Microstructures by Analytical Electron Microscopy (AEM). Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-20119-6_4
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DOI: https://doi.org/10.1007/978-3-642-20119-6_4
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-20118-9
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