Abstract
Electron diffraction possesses much shorter wavelength and higher intensity than X-ray diffraction, of which the very short wavelength makes analysis of electron diffraction pattern be simpler, and very high intensity makes a very fine crystal produce a clear diffraction pattern. The geometric condition and physical condition of electron diffraction are described, and basic equations used for analysis of electron diffraction patterns are deduced. Selected area electron diffraction (SAED), as a basic operation, is described in its principle and operating procedure. The method how to determine crystallographic directions on the image of specimen is depicted, namely, the rotation of the image relative the diffraction pattern is considered.
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© 2012 Higher Education Press, Beijing and Springer-Verlag Berlin Heidelberg
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Rong, Y. (2012). Electron Diffraction. In: Characterization of Microstructures by Analytical Electron Microscopy (AEM). Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-20119-6_3
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DOI: https://doi.org/10.1007/978-3-642-20119-6_3
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-20118-9
Online ISBN: 978-3-642-20119-6