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Research on Double-Base Regions High-Power Fast Recovery Diode

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Advanced Electrical and Electronics Engineering

Part of the book series: Lecture Notes in Electrical Engineering ((LNEE,volume 87))

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Abstract

The paper introduces the η=WI/Xm=0.25 mathematical models and adopts mathematical model VB=94ρ n 0.7 to design structure parameters of high power double-base P + PINN +  structured fast soft recovery diodes. Platinum doping and electron irradiating technologies are used to mutually control the base minority carrier lifetime and distrbution, the design method is used to optimize the structure parameter of ZKR300A/ 2500V. The design parameters were tested and verified through experiments, which proved the parameters of diodes meet the designed target and achieved the level of similar products in abroad countries. The results prove that the design method and the selected parameters are correct,lifetime control is effective.

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© 2011 Springer-Verlag Berlin Heidelberg

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An, T., Li, Y., Yin, Q. (2011). Research on Double-Base Regions High-Power Fast Recovery Diode. In: Lee, J. (eds) Advanced Electrical and Electronics Engineering. Lecture Notes in Electrical Engineering, vol 87. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-19712-3_6

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  • DOI: https://doi.org/10.1007/978-3-642-19712-3_6

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-19711-6

  • Online ISBN: 978-3-642-19712-3

  • eBook Packages: EngineeringEngineering (R0)

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