Spectroscopy of Inner Electrons

Part of the Advanced Texts in Physics book series (ADTP)


In this chapter we will discuss spectroscopic methods that involve inner electrons [5.1, 5.2]. Such electrons are much more strongly bound than outer electrons and the interaction energies become correspondingly high. Two kinds of methods are used to study inner electrons, those that are based on absorbed or emitted X-ray radiation (X-ray spectroscopy) and those dealing with energy measurements on emitted photoelectrons (photoelectron spectroscopy (XPS or ESCA)).


Outer Electron Complex Organic Molecule Rowland Circle Shell Vacancy Lead Stearate 
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  1. [5.1]
    B. Crasemann (ed.): Atomic Inner-Shell Physics (Plenum, New York 1985)Google Scholar
  2. [5.2]
    R. Karazija: Introduction to the Theory of X-Ray and Electronic Spectra of Free Atoms (Plenum, New York 1992)Google Scholar
  3. R.L. Johnson, H. Schmidt-Böcking, B.F. Sonntag (eds): X-Ray and Inner-Shell Processes, AIP Conf. Proc. 389 (AIP, New York 1997)Google Scholar
  4. R.W. Dunford, D.S. Gemmell, E.P. Kanter, B. Kräs sig, S.H. Southworth, L. Young: X-Ray and Inner Shell Processes (AIP, Melville, NY 2000)Google Scholar
  5. [5.3]
    W.C. Röntgen: Sitzungsbericht der Physikal.-Medicin. Gesellschaft 132 (Würzburg 1895): Engl. Translation: Nature 53, 274 (1896)Google Scholar
  6. G. Farmelo: The discovery of X-rays. Sci. Am. 273(5), 68 (1995)CrossRefGoogle Scholar
  7. [5.4]
    G.L. Clark: Applied X-Rays (McGraw-Hill, New York 1955)Google Scholar
  8. [5.5]
    K. Siegbahn (ed.): Alpha-, Beta-, and Gamma-Ray Spectroscopy (North-Holland, Amsterdam 1965)Google Scholar
  9. H.H. Johann: Die Erzeugung lichtstarker Röntgenspektren mit Hilfe von Konkavkristallen. Z. Physik 69, 185 (1931)ADSCrossRefGoogle Scholar
  10. Y. Cauchois: Spectrographie des rayons X par transmission d’un faisceau non canalisé à travers un cristal courbé (I). J. Phys. Rad. 3, 320 (1932)CrossRefGoogle Scholar
  11. E. För ster, E.E. Fill, K. Gäbel, H. He, Th. Missalla, O. Renner, I. Ushmann, J. Wark: X-ray emission spectroscopy. J. Quant. Spectrosc. Radiat. Transf. 51, 101 (1994)Google Scholar
  12. [5.6]
    G. Hölzer, E. Förster, M. Grätz, C. Tillman, S. Svanberg: X-ray crystal spectroscopy of sub-picosecond laser-produced plasmas beyond 50 keV, J. X-Ray Sci. Technol. 7, 50 (1997)CrossRefGoogle Scholar
  13. [5.7]
    P. Suortti, U. Lienert, C. Schulze: ‘Bent crystal optics for high energy synchrotron radiation.’ In: X-Ray and Inner Shell Processes, AIP Conference Proceedings Vol. 389, ed. by R.L. Johnson, H. Schmidt-Böcking, B.F. Sonntag (AIP, Woodbury 1997), p. 175Google Scholar
  14. [5.8]
    B. Agarwal: X-Ray Spectroscopy, 2nd edn., Springer Ser. Opt. Sci., Vol. 15 (Springer, Berlin, Heidelberg 1990)Google Scholar
  15. [5.9]
    R. Jenkins, R.W. Gould, D. Gedcke: Quantitative X-Ray Spectrometry (Dekker, New York 1981)Google Scholar
  16. [5.10]
    J.V. Gilfrich et al. (eds): Advances in X-Ray Analysis (Plenum, New York, several publishing years for series of books)Google Scholar
  17. [5.11]
    S.A.E. Johansson: Proton-induced X-ray emission spectrometry — state of the art. Fresenius Z. Anal. Chem. 324, 635 (1986)CrossRefGoogle Scholar
  18. [5.12]
    S. Johansson (ed.): Proc. 1st Int. PIXE Conf., Nucl. Instrum. Methods 142, 1 (1977); Proc. 2nd Int. PIXE Conf., Nucl. Instrum. Methods 181, 1 (1981)CrossRefGoogle Scholar
  19. B. Martin (ed.): Proc. 3rd Int. PIXE Conf., Nucl. Instrum. Methods 231, 1 (1984)Google Scholar
  20. H. van Rinsvelt, S. Bauman, J.W. Nelson, J.W. Winchester (eds;): Proc. 4th Int. PIXE Conf., Nucl. Instrum. Methods B 22, 1 (1987)Google Scholar
  21. [5.13]
    S.A.E. Johansson, J.L. Campbell, K.G. Malmqvist (eds.): Particle-Induced X-Ray Emission Spectroscopy (PIXE) (Wiley, New York 1996)Google Scholar
  22. [5.14]
    Courtesy: J. Pallon (
  23. [5.15]
    R.W. Shaw: Air pollution by particles. Sci. Am. 257(2), 84 (1987)CrossRefGoogle Scholar
  24. T.G. Dzubiey (ed.): X-Ray Fluorescence Analysis of Environmental Samples (Ann Arbor Science Publ., Ann Arbor 1977)Google Scholar
  25. [5.16]
    J. Nordgren, L. Selander, L. Pettersson, C. Nordling, K. Siegbahn, H. Ågren: Core state vibrational excitations and symmetry breaking in the CK and OK emission spectra of CO2. J. Chem. Phys. 76, 3928 (1982)ADSCrossRefGoogle Scholar
  26. [5.17]
    B. Crasemann (ed.): Proc. Conf. on X-ray and Atomic Inner Shell Physics, AIP Conf. Proc. Vol. 94 (American Inst. Phys., New York 1982), especially article by C. NordlingGoogle Scholar
  27. [5.18]
    A. Meisel, G. Leonhardt, R. Szargon: X-Ray Spectra and Chemical Bonding, Springer Ser. Chem. Phys., Vol. 37 (Springer, Berlin, Heidelberg 1989)Google Scholar
  28. [5.19]
    J. Nordgren: ‘Ultra-soft X-ray emission spectroscopy — a progress report.’ In: Proc. 14th Int. Conf. on X-Ray and Inner Shell Processes. J. Physique C 9, Suppl. 12 (1987)Google Scholar
  29. [5.20]
    J. Nordgren, C. Nordling: Ultrasoft X-ray emission from atoms and molecules. Comments At. Mol. Phys. 13, 229 (1983)Google Scholar
  30. [5.21]
    J. Nordgren, H. Ågren: Interpretation of ultra-soft X-ray emission spectra. Comments At. Mol. Phys. 14, 203 (1984)Google Scholar
  31. [5.22]
    J. Berkowitz: Photoabsorption, Photoionization, and Photoelectron Spectroscopy (Academic Press, New York 1979)Google Scholar
  32. [5.23]
    E.A. Stern: Structure determination by X-ray absorption. Contemp. Phys. 19, 289 (1978)ADSCrossRefGoogle Scholar
  33. [5.24]
    A. Bianconi, L. Incoccia, S. Stipchich (eds.): EXAFS and Near-Edge Structure, Springer Ser. Chem. Phys., Vol. 27 (Springer, Berlin, Heidelberg 1983)Google Scholar
  34. [5.25]
    B.K. Teo: EXAFS: Basic Principles and Data Analysis, Inorganic Chemistry Concept, Vol. 9 (Springer, Berlin, Heidelberg 1986)Google Scholar
  35. [5.26]
    P.A. Lee, P.H. Citrin, B.M. Kincaid: Extended X-ray absorption fine structure — its strengths and limitations as a structural tool. Rev. Mod. Phys. 53, 769 (1981)ADSCrossRefGoogle Scholar
  36. [5.27]
    R. Prinz, D. Koningsberger (eds.): X-Ray Absorption: Principles, Applications, Techniques of EXAFS, SEXAFS and XANES (Wiley, New York 1988)Google Scholar
  37. [5.28]
    J. Stöhr: NEXAFS Spectroscopy (Springer, New York 1992)Google Scholar
  38. [5.29]
    T.S. Curry III, J.E. Dowdey, R.C. Murry Jr.: Christensen’s Physics of Diagnostic Radiology, 4th edn. (Lea & Febiger, Philadelphia 1990)Google Scholar
  39. E. Krestel: Imaging Systems for Medical Diagnostics (Siemens AG, Berlin 1990)Google Scholar
  40. [5.30]
    J.G. Kereiakes, S.R. Thomas, C.G. Orton (eds.): Digital Radiography (Plenum, New York 1986)Google Scholar
  41. [5.31]
    E.J. Hall: Radiobiology for the Radiobiologist, 4th edn. (J.B. Lippincott, Philadelphia 1988)Google Scholar
  42. [5.32]
    General Electric Co., Medical Systems Operations, Milwaukee, WI (1980)Google Scholar
  43. [5.33]
    R. Lewis: Medical applications of synchrotron radiation X-rays. Phys. Med. Biol. 42, 1213 (1997)CrossRefGoogle Scholar
  44. F.A. Dilmanian, X.Y. Wu, E.C. Parsons, B. Ren, J. Kress, T.M. Button, L.D. Chapman, J.A. Coderre, P. Giron, D. Greenberg, D.J. Krus, Z. Liang, D. Marcovici, M.J. Petersen, C.T. Roque, M. Shleifer, D.N. Slatkin, W.C. Tomlinson, K. Yamamoto, J. Zhou: Single-and dual-energy CT with monochromatic synchrotron X-rays. Phys. Med. Biol. 42, 371 (1997)CrossRefGoogle Scholar
  45. [5.34]
    W.-R. Dix: Intravenous coronary angiography with synchrotron radiation. Prog. Biophys. Mol. Biol. 63, 159 (1995)CrossRefGoogle Scholar
  46. [5.35]
    T.H. Newton, D.G. Potts (eds.): Technical Aspects of Computed Tomography (Mosby, MI 1981)Google Scholar
  47. [5.36]
    R.A. Robb: Three-Dimensional Biomedical Imaging — Principles and Practice (VCH, New York 1994)Google Scholar
  48. [5.37]
    M. Murnane, H.C. Kapteyn, M.D. Rosen, R.W. Falcone: Ultrafast X-ray pulses from laser-produced plasmas. Science 251, 531 (1991)ADSCrossRefGoogle Scholar
  49. [5.38]
    J.D. Kmetec, C.L. Gordon III, J.J. Macklin, B.E. Lemoff, G.S. Brown, S.E. Harris: MeV X-ray generation with a femtosecond laser. Phys. Rev. Lett. 68, 1527 (1992)ADSCrossRefGoogle Scholar
  50. [5.39]
    K. Herrlin, G. Svahn, C. Olsson, H. Pettersson, C. Tillman, A. Persson, C.-G. Wahlström, S. Svanberg: Generation of X-rays for medical imaging by high-power lasers: Preliminary results. Radiology 189, 65 (1993)Google Scholar
  51. [5.40]
    C. Tillman, A. Persson, C.-G. Wahlström, S. Svanberg, K. Herrlin: Imaging using hard X-rays from a laser-produced plasma. Appl. Phys. B 61, 333 (1995)ADSCrossRefGoogle Scholar
  52. [5.41]
    L.-J. Hardell: High-speed radiography using laser-produced X-rays; Characteristics and applications, Lund Reports on Atomic Physics LRAP-217 (Lund Institute of Technology, Lund 1997)Google Scholar
  53. [5.42]
    C. Tillman, I. Mercer, S. Svanberg, K. Herrlin: Elemental biological imaging by differential absorption using a laser-produced X-ray source. J. Opt. Soc. Am. B 13, 209 (1996)ADSCrossRefGoogle Scholar
  54. [5.43]
    C.L. Gordon III, G.Y. Yin, B.E. Lemoff, P.E. Bell, C.P.J. Barty: Timegated imaging with an ultrashort-pulse laser-produced-plasma X-ray source. Opt. Lett. 20, 1056 (1995)ADSCrossRefGoogle Scholar
  55. [5.44]
    M. Grätz, A. Pifferi, C.-G. Wahlström, S. Svanberg: Time-gated imaging in radiology: Theoretical and experimental studies. IEEE J. Sel. Topics Quantum Electron. 2, 1041 (1996)CrossRefGoogle Scholar
  56. [5.45]
    M.F.C. Ladd, R.A. Palmer: Structure Determination by X-Ray Crystallography (Plenum, New York 1993)Google Scholar
  57. [5.46]
    R. Jimenez, C. Rose-Petruck, T. Guo, K.R. Wilson, C.P.J. Barty: ‘Timeresolved X-ray diffraction of GaAs with a 30 fs laser-driven plasma source.’ In: Ultrafast Phenomena XI ed. by W. Zinth, J.G. Fujimoto, T. Elsaesser, D. Wiersma (Springer, Berlin, Heidelberg 1998)Google Scholar
  58. M.
    Wulff, F. Schotte, G. Naylor, D. Bourgeois, K. Moffat, G. Mourou: Time-resolved structures of macromolecules at the ESRF: Single-pulse Laue diffraction, stroboscopic data collection and femtosecond flash photolysis. Nucl. Instrum. Methods Phys. Res. A 398, 69 (1997)Google Scholar
  59. [5.47]
    M.R. Howells, J. Kirz, W. Sayre: X-ray microscopes. Sci. Am. 264(2), 42 (1991)CrossRefGoogle Scholar
  60. A.G. Michette: Optical Systems for Soft X-Rays (Plenum, New York 1986)Google Scholar
  61. A.G. Michette: X-ray Microscopy. Rep. Prog. Phys. 51, 1525 (1988)ADSCrossRefGoogle Scholar
  62. A.G. Michette, G.R. Morrison, C.J. Buckley (eds.): X-ray Microscopy III, Springer Ser. Opt. Sci. Vol. 67 (Springer, Berlin, Heidelberg 1992)Google Scholar
  63. V.V. Aristov, A.I. Erko (eds.): X-ray Microscopy IV (Bogorodski Publ., Moscow Region 1995)Google Scholar
  64. G. Schmahl, D. Rudolph, J. Thieme, E. Umbach (eds.): X-ray Microscopy V (Springer, Heidelberg 1998)Google Scholar
  65. [5.48]
    L. Rymell, H.M. Hertz: Droplet target for low-debris laser-plasma soft X-ray generation, Opt. Commun. 103, 105 (1993)ADSCrossRefGoogle Scholar
  66. L. Malmqvist, L. Rymell, H.M. Hertz: Droplet-target laser-plasma source for proximity X-ray lithography. Appl. Phys. Lett. 68, 2627 (1996)ADSCrossRefGoogle Scholar
  67. L. Rymell: A new laser-plasma X-ray source for microscopy and lithography. PhD Dissertation, Lund Reports on Atomic Physics LRAP-214 (Lund Institute of Technology, Lund 1997)Google Scholar
  68. [5.49]
    J.I. Goldstein, D.E. Newbury, P. Echlin, D.C. Joy, A.D. Romig Jr., C.E. Lyman, Ch. Fiori, E. Lifshin: Scanning Electron Microscopy and X-Ray Microanalysis (Plenum, New York 1992)Google Scholar
  69. M.J. Dykstra: Biological Electron Microscopy (Plenum, New York 1992)Google Scholar
  70. [5.50]
    A.M. Hawryluk, R.H. Stulen (eds): OS A Proceedings on Soft X-ray Lithography, Vol. 18 (Optical Society of America, Washington, DC 1993)Google Scholar
  71. G.D. Kubiak, D.R. Kania (eds.): Extreme Ultraviolet Lithography, OSA Trends in Optics and Photonics, Vol. 4 (OSA, Washington, DC 1996)Google Scholar
  72. [5.51]
    S.M. Sze: Semiconductor Device Physics and Technology (Wiley, New York 1985)Google Scholar
  73. W.P. Kirk, M.A. Reed (eds.): Nanostructures and Mesoscopic Systems (Academic Press, New York 1992)Google Scholar
  74. C. Weisbuch, B. Vinter: Quantum Semiconductor Structures (Academic Press, San Diego 1991)Google Scholar
  75. [5.52]
    B. Lindberg, R. Maripuu, K. Siegbahn, R. Larsson, C.G. Gölander, J.C. Eriksson: ESCA studies of heparinized and related surfaces. J. Colloid Interface Sci. 95, 308 (1983)CrossRefGoogle Scholar
  76. [5.53]
    K. Siegbahn et al. (eds.): ESCA: Atomic, Molecular and Solid State Structure Studied by Means of Electron Spectroscopy (Almqvist and Wiksell, Uppsala 1967)Google Scholar
  77. [5.54]
    H. Siegbahn, L. Karlsson: ‘Photoelectron Spectroscopy.’ In: Handbuch der Physik, Vol. 31, ed. by E. Mehlhorn (Springer, Berlin, Heidelberg 1982)Google Scholar
  78. [5.55]
    C.R. Brundle, A.D. Baker (eds.): Electron Spectroscopy: Theory, Techniques and Applications, Vols. 1–5 (Academic Press, New York 1977-84)Google Scholar
  79. [5.56]
    R.E. Ballard: Photoelectron Spectroscopy and Molecular Orbital Theory (Hilger, London 1978)Google Scholar
  80. [5.57]
    P. Weightman: X-ray excited Auger and photoelectron spectroscopy. Rep. Prog. Phys. 45, 753 (1982)ADSCrossRefGoogle Scholar
  81. [5.58]
    K. Siegbahn: ‘Some Current Problems in Electron Spectroscopy.’ In: Atomic Physics 8, ed. by I. Lindgren, A. Rosén, S. Svanberg (Plenum, New York 1983) p. 243Google Scholar
  82. [5.59]
    K. Siegbahn: Photoelectron spectroscopy: retrospects and prospects. Phil. Trans. Roy. Soc. Lond. A 318, 3 (1986)ADSCrossRefGoogle Scholar
  83. [5.60]
    S. Hüfner: Photoelectron Spectroscopy, 2nd edn., Springer Ser. Solid-State Sci., Vol.82 (Springer, Heidelberg 1996)Google Scholar
  84. [5.61]
    U. Becker, D.A. Shirley (eds): VUV and Soft X-Ray Photoionization (Plenum, New York 1995)Google Scholar
  85. [5.62]
    N.V. Smith, F.J. Himpsel: ‘Photoelectron Spectroscopy.’ In: Handbook of Synchrotron Radiation, ed. by E.E. Koch (North-Holland, Amsterdam 1983)Google Scholar
  86. [5.63]
    J.W. Rabalais: Principles of Ultraviolet Photoelectron Spectroscopy (Wiley-Interscience, New York 1977)Google Scholar
  87. [5.64]
    S. Svensson, N. Mårtensson, E. Basilier, P.Å. Malmquist, U. Gelius, K. Siegbahn: Core and valence orbitals in solid and gaseous mercury by means of ESCA. J. Electron. Spectrosc. Rel. Phenom. 9, 51 (1976)CrossRefGoogle Scholar
  88. [5.65]
    K. Siegbahn: Electron Spectroscopy and molecular structure. J. Pure Appl. Chem. 48, 77 (1976)CrossRefGoogle Scholar
  89. [5.66]
    H. Siegbahn: Electron Spectroscopy for chemical analysis of liquids and solutions. J. Phys. Chem. 89, 897 (1985)CrossRefGoogle Scholar
  90. [5.67]
    L.-G. Petersson, S.-E. Karlsson: Clean and oxygen-exposed potassium studied by photoelectron Spectroscopy. Phys. Scr. 16, 425 (1977)ADSCrossRefGoogle Scholar
  91. [5.68]
    R.H. Williams: Electron spectroscopy of surfaces. Contemp. Phys. 19, 389 (1978)ADSCrossRefGoogle Scholar
  92. [5.69]
    K. Siegbahn: ‘Electron Spectroscopy for solids, surfaces, liquids and free molecules.’ In: Molecular Spectroscopy, ed. by A.R. West (Heyden, London 1977) Chap. 15Google Scholar
  93. [5.70]
    D. Briggs, M.P. Seah (eds.): Practical Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy (Wiley, Chichester 1983)Google Scholar

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© Springer-Verlag Berlin Heidelberg 2004

Authors and Affiliations

  1. 1.Department of PhysicsLund Institute of TechnologyLundSweden

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