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12 Infrastructure Intellectual Property for SoC Simulation and Diagnosis Service

  • Chapter
Design of Digital Systems and Devices

Part of the book series: Lecture Notes in Electrical Engineering ((LNEE,volume 79))

Abstract

The models and methods for creating Infrastructure Intellectual Property (I-IP) service for the functionalities System on Chip (SoC), which has a minimum set of the real time Built-In Self Test (BIST) tools, are proposed in this chapter. The means I-IP provide an opportunity to services: fault modeling and simulation for the functional primitives to evaluate the test quality and to build Fault Detection Table (FDT); diagnosis of a given defects search depth in the SoC; repairing embedded memory functionality, by using spare row and column components. High performance deductive-parallel fault analysis method for building FDT and tests quality assessment is offered. Algebra logical methods of fault diagnosis and embedded memory repair by synthesis Disjunctive Normal Form (DNF) completing all decisions for diagnosis SoC functionalities in the real time are represented.

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Author information

Authors and Affiliations

  1. Kharkov National University of Radioelectronics, Apt. 321, Lenin Avenue, 14, Kharkov, 61166, Ukraine

    Vladimir Hahanov

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  1. Vladimir Hahanov
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Editors and Affiliations

  1. Institute of Computer Eng. & Electronics, University of Zielona Góra, ul. Podgórna 50, 65-246, Zielona Góra, Poland

    Marian Adamski  & Alexander Barkalov  & 

  2. Institute of Computer Eng. & Electronics, University of Zielona Góra, ul. Podgórna 50, 65-246, Zielona, Poland

    Marek Węgrzyn

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Hahanov, V. (2011). 12 Infrastructure Intellectual Property for SoC Simulation and Diagnosis Service. In: Adamski, M., Barkalov, A., Węgrzyn, M. (eds) Design of Digital Systems and Devices. Lecture Notes in Electrical Engineering, vol 79. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-17545-9_12

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  • DOI: https://doi.org/10.1007/978-3-642-17545-9_12

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-17544-2

  • Online ISBN: 978-3-642-17545-9

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