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Nanoscopic Architecture and Microstructure

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Springer Handbook of Metrology and Testing

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Abstract

The methods compiled in this chapter are important in many areas of materials science and technology because various physical properties of materials (mechanical, thermal, electronic, optical, magnetic, dielectric, biological) depend on their geometric architecture, on scales ranging from the atomic or nanoscopic to the semimicroscopic. Some of the properties are governed only by an elementary atomic group in the structural hierarchy while others are brought about by cooperative functioning of multiple phases or microscopic structures in different dimensions. Corresponding to the vast variety of materials and their properties, a wide range of experimental techniques are available, so that the choice of which technique to employ on starting a study may not be clear. In this respect one should also bear in mind that some of the techniques presented in this chapter are based on physical principles, which are also relevant to the measurement methods compiled in Chaps. 6 and 11.

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Abbreviations

AES:

Auger electron spectroscopy

AFM:

atomic force microscope

AFM:

atomic force microscopy

BF:

bright field

CBED:

convergent beam electron diffraction

CD:

circular dichroism

CE:

Communauté Européenne

CE:

Conformité Européenne

CE:

capillary electrophoresis

CE:

counter electrode

CL:

cathodoluminescence

COSY:

correlated spectroscopy

CT:

compact tension

CT:

compact test

CT:

computed tomography

DF:

dark field

DLTS:

deep-level transient spectroscopy

DNA:

deoxyribonucleic acid

EBIC:

electron-beam-induced current

ECP:

electron channeling pattern

EDMR:

electrically detected magnetic resonance

EDX:

energy dispersive x-ray

EELS:

electron energy-loss spectroscopy

EF:

emission factors

ENDOR:

electron nuclear double resonance

EPMA:

electron probe microanalysis

EPR:

electron paramagnetic resonance

ESR:

electron spin resonance

EXAFS:

extended x-ray absorption fine structure

FID:

free induction decay

FIM:

field ion microscopy

FOLZ:

first-order Laue zone

FRET:

fluorescence resonant energy transfer

FT:

Fourier transform

GC:

gas chromatography

GE:

gel electrophoresis

GP:

Guinier–Preston

HAADF:

high-angle annular dark-field

HOLZ:

higher-order Laue zone

HR:

Rockwell hardness

HRTEM:

high-resolution transmission electron microscopy

IR:

infrared

IRAS:

infrared absorption spectroscopy

LC:

liquid chromatography

LC:

liquid crystal

LDOS:

local density of states

LSCM:

laser scanning confocal microscope

LVM:

local vibrational mode

MCD:

magnetic circular dichroism

MCDA:

magnetic circular dichroic absorption

MCPE:

magnetic circular-polarized emission

MEM:

maximum entropy method

MRI:

magnetic resonance imaging

NEXAFS:

near-edge x-ray absorption fine structure

NMR:

nuclear magnetic resonance

NOE:

nuclear Overhauser effect

ODF:

orientation distribution function

ODMR:

optically detected magnetic resonance

OM:

optical microscopy

ORD:

optical rotary dispersion

PAC:

Pacific Accreditation Cooperation

PAC:

perturbed angular correlation

PAS:

positron annihilation spectroscopy

PCI:

phase contrast imaging

PCR:

polymerase chain reaction

PEELS:

parallel electron energy loss spectroscopy

PL:

photoluminescence

RF:

radiofrequency

SAD:

selected area diffraction

SE:

secondary electron

SEM:

scanning electron microscopy

SNOM:

scanning near-field optical microscopy

SOLZ:

second-order Laue zone

SPI:

selective polarization inversion

SPM:

scanning probe microscopy

SPM:

self-phase modulation

STEM:

scanning transmission electron microscopy

STM:

scanning tunneling microscopy

STS:

scanning tunneling spectroscopy

TEM:

transmission electron microscopy

TIRFM:

total internal reflection fluorescence microscopy

TOF:

time of flight

XCT:

x-ray computed tomography

XPS:

x-ray photoelectron spectroscopy

XPS:

x-ray photoemission spectroscopy

XRT:

x-ray topography

YAG:

yttrium aluminum garnet

ZOLZ:

zero-order Laue zone

bcc:

body-centered-cubic

fcc:

face-centered cubic

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Authors and Affiliations

  1. Department of Applied Physics, The University of Tokyo, Hongo, Bunkyo-ku, 113-8656, Tokyo, Japan

    Koji Maeda Prof.

  2. Institute of Materials Science, University of Tsukuba, 305-8573, Tsukuba, Ibaraki, Japan

    Hiroshi Mizubayashi

Authors
  1. Koji Maeda Prof.
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  2. Hiroshi Mizubayashi
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Correspondence to Koji Maeda Prof. or Hiroshi Mizubayashi .

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Editors and Affiliations

  1. University of Applied Sciences Berlin, Luxemburger Strasse 10, 13353, Berlin, Germany

    Horst Czichos Prof.

  2. National Institute for Materials Science (NIMS), Tsukuba, Ibaraki, Japan

    Tetsuya Saito

  3. National Institute of Standards and Technology (NIST), Gaithersburg, MD, USA

    Leslie Smith

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Maeda, K., Mizubayashi, H. (2011). Nanoscopic Architecture and Microstructure. In: Czichos, H., Saito, T., Smith, L. (eds) Springer Handbook of Metrology and Testing. Springer Handbooks. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-16641-9_5

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