Abstract
At present, optical measurement methods are the most powerful tools for basic and applied research and inspection of the characteristic properties of a variety of materials, especially following the development of lasers and computers. Optical measurement methods are widely used for optical spectroscopy including linear and nonlinear optics and magneto-optics, conventional and unconventional optical microscopy, fiber optics for passive and active devices, optical recording for CD/DVD and MO disks, and various kinds of optical sensing.
In this chapter, as an introduction to the following sections, the concept and fundamentals of optical spectroscopy are described in Sect. 11.1, including optical measurement tools such as light sources, detectors and spectrometers, and standard optical measurement methods such as reflection, absorption, luminescence, scattering, etc. A short summary of laser instruments is also included. In Sect. 11.2 the microspectroscopic methods that have recently become quite useful for nano-science and nano-technology are described, including single-dot/molecule spectroscopy, near-field optical spectroscopy and cathodo-luminescence spectroscopy using scanning electron microscopes. In Sect. 11.3 magneto-optics such as Faraday rotation is introduced and the superlattice of semi-magnetic semiconductors is applied for the imaging measurement of magnetic flux patters of superconductors as an example of spintronics. Section 11.4 is devoted to fascinating subjects in laser spectroscopy, such as nonlinear spectroscopy, time-resolved spectroscopy and THz spectroscopy. In Sect. 11.5 fiber optics is summarized, including transmission properties, nonlinear optical properties, fiber gratings, photonic crystal fibers, etc. In Sect. 11.6 optical recording technology for high-density storage is described in detail, including the measurement methods for the characteristic properties of phase-change and magneto-optical materials. Finally, in Sect. 11.7 a variety of optical sensing methods are described, including the measurement of distance, displacement, three-dimensional shape, flow, temperature and, finally, the human body for bioscience and biotechnology.
This chapter begins with a section on basic technology for optical measurements. Sections 11.2–11.4 deal with advanced technology for optical measurements. Finally Sects. 11.5–11.7 discuss practical applications to photonic devices.
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Abbreviations
- AES:
-
Auger electron spectroscopy
- AFM:
-
atomic force microscope
- AFM:
-
atomic force microscopy
- APD:
-
avalanche photodiodes
- ASE:
-
amplified spontaneous emission
- BCS:
-
Bardeen–Cooper–Schrieffer
- BER:
-
bit error rate
- CARS:
-
coherent anti-Stokes Raman spectroscopy
- CCD:
-
charge-coupled device
- CD:
-
circular dichroism
- CFD:
-
computational fluid dynamics
- CL:
-
cathodoluminescence
- CW:
-
continuous wave
- DC:
-
direct current
- DFG:
-
difference frequency generation
- DMS:
-
diluted magnetic semiconductor
- DSC:
-
differential scanning calorimeter
- DTA:
-
differential thermal analysis
- DWDD:
-
domain-wall displacement detection
- DWDM:
-
dense wavelength-division multiplexed
- ED:
-
electron diffraction
- EDFA:
-
Er-doped fiber amplifier
- EL:
-
electroluminescence
- EPMA:
-
electron probe microanalysis
- FBG:
-
fiber Bragg grating
- FLN:
-
fluorescence line narrowing
- FTS:
-
Fourier-transform spectrometer
- FWM:
-
four-wave mixing
- GDD:
-
group delay dispersion
- GVD:
-
group velocity dispersion
- HGW:
-
hollow grass waveguide
- HMFG:
-
heavy-metal fluoride glass fiber
- ICP:
-
inductively coupled plasma
- IR:
-
infrared
- KLM:
-
Kerr-lens mode-locking
- LC:
-
liquid chromatography
- LC:
-
liquid crystal
- LD:
-
Lawrence–Doniach
- LD:
-
laser device
- LD:
-
laser diode
- LDV:
-
laser Doppler velocimeter
- LED:
-
light-emitting diode
- LIF:
-
laser-induced fluorescence
- MCA:
-
multichannel analyzer
- MCP:
-
microchannel plate
- MD:
-
molecular dynamics
- MFD:
-
mode field diameter
- MFM:
-
magnetoforce micrometer
- MO:
-
magnetooptical
- MOL:
-
magnetooptical layer
- MON:
-
monochromator
- MOS:
-
metal–oxide–semiconductor
- NA:
-
numerical aperture
- ND:
-
neutron diffraction
- NEP:
-
noise-equivalent power
- OCT:
-
optical coherence tomography
- OKE:
-
optical Kerr effect
- OPA:
-
optical parametric amplifier
- OPG:
-
optical parametric generation
- OPO:
-
optical parametric oscillator
- OR:
-
optical rectification
- OTDR:
-
optical time-domain reflectometry
- PBG:
-
photonic band gap
- PC:
-
personal computer
- PC:
-
photoconductive detector
- PC:
-
polycarbonate
- PCF:
-
photonic crystal fiber
- PEM:
-
photoelectromagnetic
- PL:
-
photoluminescence
- PLE:
-
PL excitation
- PMMA:
-
poly(methyl methacrylate)
- PMT:
-
photomultiplier tube
- POL:
-
polychromator
- PT:
-
phototube
- PV:
-
photovoltaic
- PVA:
-
polyvinyl acetate
- QE:
-
quantum effect
- RBS:
-
Rutherford backscattering
- RE:
-
reference electrode
- RH:
-
relative humidity
- SBR:
-
styrene butyl rubber
- SBS:
-
sick-building syndrome
- SD:
-
strength difference
- SEM:
-
scanning electron microscopy
- SFG:
-
sum frequency generation
- SHG:
-
second-harmonic generation
- SIMS:
-
secondary ion mass spectrometry
- SMSC:
-
study semiconductor
- SNOM:
-
scanning near-field optical microscopy
- SNR:
-
signal-to-noise ratio
- SPM:
-
scanning probe microscopy
- SPM:
-
self-phase modulation
- SPOM:
-
surface potential microscope
- SRS:
-
stimulated Raman scattering
- TAC:
-
time-to-amplitude converter
- TCSPC:
-
time-correlated single-photon counting
- TDS:
-
thermal desorption mass spectrometry
- TDS:
-
total dissolved solid
- TEM:
-
transmission electron microscopy
- THG:
-
third-harmonic generation
- TPA:
-
two-photon absorption
- UV:
-
ultraviolet
- VCSEL:
-
vertical-cavity surface-emitting laser
- VSM:
-
vibrating-sample magnetometer
- WDM:
-
wavelength division multiplexing
- XMA:
-
x-ray micro analyzer
- XPS:
-
x-ray photoelectron spectroscopy
- XPS:
-
x-ray photoemission spectroscopy
- XRD:
-
x-ray diffraction
- YAG:
-
yttrium aluminum garnet
- YIG:
-
yttrium-iron garnet
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Itoh, T., Araki, T., Ashida, M., Iwata, T., Muro, K., Yamada, N. (2011). Optical Properties. In: Czichos, H., Saito, T., Smith, L. (eds) Springer Handbook of Metrology and Testing. Springer Handbooks. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-16641-9_11
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