Errata to: Metallic Micro and Nano Materials

The online version of the original book can be found under doi:10.1007/978-3-642-15411-9.

Errata to: EngMat

DOI: 10.1007/978-3-642-15411-9

Preface (pp. v–vi)

Location	Printed	Should be	Comment
p. vi	Akita	Sendai	City name for H. Tohmyoh

Introduction (pp. 1–14)

Location	Printed	Should be	Comment
None

Basis of Atomic Diffusion (pp. 15–52)

Location	Printed	Should be	Comment
p. 16, line 13	results	result	Delete “s”
p. 23, line 19	acceleration test of EM	acceleration test of EM for IC Al lines	Add “for IC Al lines”
p. 26, line 9	j x	j x	Put “x” in italics
p. 26, line 10	J x	j x	Decapitalize “J” and put “x” in italics
p. 27, line 4	,	.	Change comma to period after Eq. (33)
p. 30, line 17	0.00442	0.00442.	Add period
p. 34, line 6	$- 2\left. {\frac{{\kappa \Upomega \partial^{2} N}}{{N_{0} \partial x\partial y}}\sin \,2\theta } \right\}$	$- 2\left. {\frac{\kappa \Upomega }{{N_{0} }}\frac{{\partial^{2} N}}{\partial x\partial y}\sin \,2\theta } \right\}$	Divide into two fractions
p. 37, line 5	Printed
	$+ \frac{\sqrt 3 }{4}\pi d\left[ { - \frac{\kappa \Upomega }{{N_{0} }}\left( {\frac{{\partial^{2} N}}{2} + \frac{{\partial^{2} N}}{{\partial y^{2} }}} \right) - \frac{{\kappa \Upomega /N_{0} }}{kT}\left( {D_{x} \frac{\partial N}{\partial x} + D_{y} \frac{{}}{\partial y}} \right)} \right.$
	Should be
	$+ \frac{\sqrt 3 }{4}\pi d\left[ { - \frac{\kappa \Upomega }{{N_{0} }}\left( {\frac{{\partial^{2} N}}{{\partial x^{2} }} + \frac{{\partial^{2} N}}{{\partial y^{2} }}} \right) - \frac{{\kappa \Upomega /N_{0} }}{kT}\left( {D_{x} \frac{\partial N}{\partial x} + D_{y} \frac{\partial N}{\partial y}} \right)} \right.$
	Comment
	Insert “∂x” into denominator and “∂N” into numerator
p. 37, line 14	comparing	comparing void formation in	Add “void formation in”
p. 38, line 3	Printed
	$= \frac{{\sqrt{3}}d^{2}}{4\delta }\left[ {AFD_{\text{gen}}^{*} |{\text{end}} + \frac{{\partial AFD_{\text{gen}}^{*} |{\text{end}}}}{\partial x}\left( {l_{d} - l^{*} } \right)} \right]$
	Should be
	$= \frac{{\sqrt{3}}d^{2}}{4\delta }\left[ {AFD_{\text{gen}}^{*} |{\text{end}} + \frac{{\partial AFD_{\text{gen}}^{*} |{\text{end}}}}{\partial x}\left( {l_{d} - l^{*} } \right)} \right]$
	Comment
	Put “end” in inferior
p. 38, line 11	Printed
	$v_{d} = \left[ {AFD_{\text{gen}}^{*} |{\text{end}} + \frac{{\partial AFD_{\text{gen}}^{*} |{\text{end}}}}{\partial x}\left( {l_{d} - l^{*} } \right)} \right]l^{*} \Upomega$
	Should be
	$v_{d} = \left[ {AFD_{\text{gen}}^{*} |_{\text{end}} + \frac{{\partial AFD_{\text{gen}}^{*} |_{\text{end}} }}{\partial x}\left( {l_{d} - l^{*} } \right)} \right]l^{*} \Upomega$
	Comment
	Put “end” in inferior
p. 39, line 4	Printed
	$F_{\text{gb}}^{*} |{\text{end = }}\sum\limits_{i} {} \sum\limits_{j} {} \left\{ {v_{d} |_{ij} - \left[ {(AFD_{\text{gen}}^{*} |{\text{end)}}_{i} + \left( {\frac{{\partial AFD_{\text{gen}}^{*} |{\text{end}}}}{\partial x}} \right)_{i} (l_{d} |_{ij} - l^{*} )} \right]l^{*} \Upomega } \right\}^{2}$
	Should be
	$F_{\text{gb}}^{*} |_{\text{end}} { = }\sum\limits_{i} {} \sum\limits_{j} {} \left\{ {v_{d} |_{ij} - \left[ {(AFD_{\text{gen}}^{*} |_{\text{end}} )_{i} + \left( {\frac{{\partial AFD_{\text{gen}}^{*} |_{\text{end}} }}{\partial x}} \right)_{i} (l_{d} |_{ij} - l^{*} )} \right]l^{*} \Upomega } \right\}^{2}$
	Comment
	Put “end” in inferior
p. 45, line 3 of figure caption of Fig. 14	[71]	[72]	Change reference number

Fabrication of Micro and Nano Metallic Materials (pp. 53–92)

Location	Printed	Should be	Comment
p. 55, line 17	‘the electro-thermal’	the ‘electro-thermal’	Change position of single quotation marks
p. 72, line 4	EM failure	EM failure in IC	Add “in IC”
p. 72, line 12	Eqs. (55), (57)	Eqs. (55)–(57)	Replace a comma with an en dash
p. 72, line 13	Eq. (58) in Basis of Atomic Diffusion given in Sect. 1.7 in Basis of Atomic Diffusion	Eq. (58) given in Sect. 1.7 in Basis of Atomic Diffusion	Delete the first “in Basis of Atomic Diffusion”
p. 73, line 2	Assuming	Assume	Be in imperative form
p. 81, line 15	chpater	chapter	Misspelling
p. 89, line 17	Acknowledgments	Acknowledgment	Change to singular

Evaluation of Mechanical Properties (pp. 93–142)

Location	Printed	Should be	Comment
p. 99, line 4	called as	called the	Change “as” to “the”
p. 101, in 3rd line from bottom	large value.	large value (see Sect. 2.4).	Insert “(see Sect. 2.4)”
p. 101, in 2nd line from bottom	called as	called the	Change “as” to “the”
p. 102, line 6	called as	called	Delete “as”
p. 105, in 4th line after Eq. (12)	rotary inertia)	rotary inertia	Delete a parenthesis
p. 113, line 4	Sect. 3.3.1	Sect. 3.1 in the preceding chapter	Replace “3.3.1” with “3.1 in the preceding chapter”
p. 124, in 1st line before Eq. (62)	in Eq. (53)	in Eq. (42)	Change 53 to 42
p. 130, line 16	spuattering	spattering	Misspelling
p. 133, line 1	Printed		Delete indent
	Nano/Micromaterials
	Should be
	Nano/Micromaterials
p. 136, line 1 of figure caption of Fig. 31	aE…bσY…cE’…	aE…bσY…cE’…	Insert a space for each
p. 137, in Acknowledgments	M.Muraoka. H.Tohmyoh.	M. M. H. T.	Change to initials

Evaluation of Electrical Properties (pp. 143–172)

Location	Printed	Should be	Comment
p. 145, line 15	nanowires	nanowire	Change to singular
p. 146, line 28	diameter a the only lateral dimension	diameter is the only lateral dimension	Change “a” to “is”
p. 151, the end of the caption of Fig. 4		(scale bar 2μm)	Add (scale bar 2μm)
p. 152, line 24	[24, 29]	[25, 28]	Change reference numbers
p. 152, line 37; p. 154, lines 4, 8 and 18; p. 156, line 14	[29]	[28]	Change reference number
p. 157, the last line of caption of Fig. 9	the mean	the variation of them	Replace “mean” with “variation of them”
p. 157, line 11	is on the nanometer	on the nanometer	Delete “is”
p. 158, line 17	[27]	[23]	Change reference number
p. 158, line 29	[25, 26, 30, 31]	[26, 29, 30, 31]	Change 25 to 29
p. 159, lines 9, 26 and 34	[25]	[26]	Change reference number
p. 159, line 16	strong	strongly	Change to adverb
p. 159, line 36; p. 161, line 7	[26]	[29]	Change reference number
p. 163, line 11	the step height of	the step height is	Change “of” to “is”
p. 165, line 5	simultaneous	simultaneously	Change to adverb
p. 166, line 11–12	[23, 28]	[24, 27]	Change reference numbers
p. 167, line 1	Symbolω	Symbol ω	Insert a space
p. 167, lines 4 and 8	[28]	[24]	Change reference number
p. 168, line 12	Eqs. 5–8 and 5–11	Eqs. 8 and 11	Delete “5-” for each
p. 169, the last line of caption of Fig. 19	13	12	Change footnote number
p. 170, ref. 28	(2007a)	(2007)	Delete “a”
p. 170, ref. 29	(2007b)	(2007)	Delete “b”
p. 171, line 5	31.	32.	Change reference number

Modification of Nano/Micromaterials (pp. 173–220)

Location	Printed	Should be	Comment
p. 173, line 7 in Abstract	in thin wires are	in thin wires is	Change “are” to “is”
p. 175, line 1 of figure caption of Fig. 2	10-nmdiameter	10-nm diameter	Insert a space
p. 177, line 6 from bottom	K = 72 W/mK	K = 72 W/(mK)	“mK” should be parenthesized
p. 177, line 5 from bottom	c = 134 J/kg K	c = 134 J/(kg K)	“kg K” should be parenthesized
p. 179, in 13th line from bottom	K = 72 W/mK	K = 72 W/(mK)	“mK” should be parenthesized
p. 179, in 13th line from bottom	c = 134 J/kg K	c = 134 J/(kg K)	“kg K” should be parenthesized
p.179, in 12th line from bottom	H = 30 W/m2K	H = 30 W/(m2K)	“m2K” should be parenthesized
p. 181, line 2	Eq. (1).	1.2.	Change Eq. (1) to 1.2
p. 183, Table 1	I/A	I/A	Variables I and A should be italic
p. 188, line 2 of figure caption of Fig. 12	of A in b	of A in a	Change b to a
p. 188, in 5th line from bottom	Figure 13a–d correspond to	Figure 13a–d corresponds to	Change “correspond” to “corresponds”
p. 192, line 6	shown experimentally	experimentally	Delete “shown”
p. 196, line 10	Figure 20a and b represents	Figure 21a and b represents	Change 20 to 21
p. 196, line 12	Figure 21a–d shows	Figure 21c and d shows	Change “a–d” to “c and d”
p. 203, line 6 of figure caption of Fig. 27	electrode 3 and 4	electrodes 3 and 4	Change “electrode” to “electrodes”
p. 204, line 5	in the previous section,	in Sect. 2.3.2,	Change “the previous section” to “Sect. 2.3.2”
p. 205, in 9th- 10th lines from bottom	SiC ([68], BC [33], and NaFe4P12 [32] have	SiC [68], BC [33], and NaFe4P12 [32], have	Delete a parenthesis and insert a comma after [32]
p. 210, line 7	Sect. 3.3.1	Sect. 3.1 in Fabrication of Micro and Nano Metallic Materials	Replace “3.3.1” with “3.1 in Fabrication of Micro and Nano Metallic Materials”
p. 216, in 7th line from bottom	(See Table 1	(see Table 1	Change to lowercase
p. 216, in 6th line from bottom	(See Fig.21a	(see Fig. 21a	Change to lowercase and insert a space before 21a

Index (pp. 221–225)

Location	Printed	Should be	Comment
p. 221	Acceleration test, 23, 25, 33, 38, 40, 42, 45, 49	Acceleration test, 23, 25, 33, 38, 40, 42	Delete 45 and 49
p. 221	Anodic alumina, 5, 6, 145	Anodic alumina, 5, 6, 146	Change 145 to 146
p. 221	Aspect ratio, 46, 57, 59, 159, 160	Aspect ratio, 46, 57, 59, 159, 162	Change 160 to 162
p. 221	Printed		Delete 35 for atomic diffusion
	Atomic
			Delete 48 and 63 for atomic flux
	diffusion, 11, 15, 16, 18, 19, 35, 36, 43, 46, 54, 82, 212
	flux, 15, 17-21, 33, 36-38, 47, 48, 63, 66
	Should be
	Atomic
	diffusion, 11, 15, 16, 18, 19, 36, 43, 46, 54, 82, 212
	flux, 15, 17-21, 33, 36-38, 47, 66
p. 221	Printed		Insert a hyphen before “strength” and change 129 to 128
	Bond-order-bond-length-bond strength (bond-OLS) correlation, 129
	Should be
	Bond-order-bond-length-bond-strength (bond-OLS) correlation, 128
p. 221	Brass (BS), 168	Brass (BS), 169	Change 168 to 169
p. 221	Cantilever, 94, 98, 105, 107, 110, 121, 129, 133, 152, 159, 162, 213	Cantilever, 94, 98, 105, 107, 110, 121, 129, 133, 152, 160, 162, 213	Change 159 to 160
p. 221	Printed		Delete 34
	Characteristic
	constant, 15, 34, 35, 37, 39, 41, 42
	Should be
	Characteristic
	constant, 15, 35, 37, 39, 41, 42
p. 221	Coaxial line, 163, 164, 167	Coaxial line, 164, 167	Delete 163
p. 221	Printed		Change 160 to 161 for crystalline plane
	Crystalline, 99, 112, 213 plane, 159, 160
	Should be
	Crystalline, 99, 112, 213 plane, 159, 161
p. 222	Printed		Indent “modulus”
	Elastic
	modulus, 2, 12, …
	Should be
	Elastic
	modulus, 2, 12, …
p. 222	Printed		Replace a hyphen with a space before “evaporation”
	Electron, 17, 35, 43, 48
	-beam-evaporation technique (EBET), 210
	Should be
	Electron, 17, 35, 43, 48
	-beam evaporation technique (EBET), 210
p. 223	Printed		Insert a space before “fit”
	Least-squares method (least-squaresfit), 38,
	Should be
	Least-squares method (least-squares fit), 38,
p. 223	Lifetime, 16, 19, 20, 34, 62, 75, 78, 79, 80	Lifetime, 16, 19, 20, 35, 62, 75, 78, 79, 80	Change 34 to 35
p. 223	Printed		Replace a hyphen with a space before “atom”
	Lower-coordinated surface-atom, 128
	Should be
	Lower-coordinated surface atom, 128
p. 223	Printed		Add 102 for mechanical diode and delete 136 for mechanical property
	Mechanical
	diode (MD), 101
	property, 45, 93, 126, 130, 136
	Should be
	Mechanical
	diode (MD), 101, 102
	property, 45, 93, 126, 130
p. 223	Misfit strain, 206, 208, 214	Misfit strain, 205, 208, 214	Change 206 to 205
p. 223	Printed		2 is inferior
	Molybdenum disulfide (MoS2),
	Should be
	Molybdenum disulfide (MoS2),
p. 223	Printed		Delete “of area” and add 109
	Moment
	of inertia, see also rotary inertiaof area, 104
	Should be
	Moment
	of inertia, see also rotary inertia, 104, 109
p. 224	Printed		Insert a space after “deposition” and add 76
	Plasma-enhanced chemical vapor deposition(PE-CVD), 39
	Should be
	Plasma-enhanced chemical vapor deposition (PE-CVD), 39, 76
p. 224	Printed		Move 97 behind “Polycrystalline” and delete 36
	Polycrystalline
	line, 18, 20, 33, 34, 35, 36, 37, 74, 97
	Should be
	Polycrystalline, 97
	line, 18, 20, 33, 34, 35, 37, 74
p. 224	Rotary inertia, 105, 109, 114	Rotary inertia, 105, 114	Delete 109
p. 224	Printed		Delete one 44 for scanning electron microscope Change 162 to 163 for scanning profile
	Scanning
	electron microscope (SEM), 42, 44, 44, 47,
	profile, 162, 165
	Should be
	Scanning
	electron microscope (SEM), 42, 44, 47,
	profile, 163, 165
p. 224	Silicon (Si)	Silicon (Si)	2 is inferior
	dioxide (SiO2),	dioxide (SiO2),
p. 224	Silicon (Si)	Silicon (Si)	3 and 4 are inferior
	nitride (Si3N4),	nitride (Si3N4),
p. 224	Size-dependent, 144, 145, 169	Size-dependent, 144, 145	Delete 169
p. 225	Printed		Delete 19 for stress migration Delete 44 and 46 for stress release
	Stress
	migration (SM), 4, 6, 15, 19, 42, 43, 45, 46, 47, 48, 113
	release, 11, 44, 46, 54
	Should be
	Stress
	migration (SM), 4, 6, 15, 42, 43, 45, 46, 47, 48, 113
	release, 11, 54
p. 225	Printed		Add another expression
	Template
	assisted synthesis, 146
	Should be
	Template
	assisted synthesis, 146
	-based synthesis, 4, 5, 6
p. 225	Printed		2 is inferior
	Tin dioxide (SnO2),
	Should be
	Tin dioxide (SnO2),

Back Cover

Location	Printed	Should be	Comment
line 18	expected are	expected to be	Delete “expected are”
	expected to be

Table 10 Evaluation of Electrical Properties (pp. 143–172)