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Evaluation of Electrical Properties

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Part of the Engineering Materials book series (ENG.MAT.)

Abstract

Electrical property is one of the important intrinsic properties of materials, which strongly affects the functionality of materials, especially for metallic nanomaterials. The evaluation of electrical properties plays a significant role in distinguishing the electrical factors of metallic nanomaterials. In this chapter, the methods for evaluating the electrical properties of metallic nanomaterials are described. First, the recent researches on the measurement of electrical properties of metallic nanomaterials are summarized. Then, four-point probe (FPP) method, which is the most common and effective method to measure the resistivity of metallic nanowires, is introduced. Next, a four-point AFM probe method which combines the conventional FPP method with the atomic force microscope thereby providing a capability to characterize the local resistivity of metallic nanomaterials is represented. Finally, a next-generation technique, microwave AFM method which can measure the topography and distribution of electrical properties of nanomaterials simultaneously, is explained.

Keywords

Atomic Force Microscope Contact Resistance Standoff Distance Microwave Signal Atomic Force Microscope Probe 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Notes

Acknowledgments

The author acknowledges partial support from the Japan Society for the Promotion of Science under Grant-in-Aid for Scientific Research (A) Grant No. 20246028, and Dr. M. Chen for his help in preparing the manuscript.

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© Springer-Verlag Berlin Heidelberg 2010

Authors and Affiliations

  1. 1.Department of Mechanical Science and EngineeringNagoya UniversityNagoyaJapan

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