Skip to main content
Book cover

International Conference on Distributed Computing and Internet Technology

ICDCIT 2010: Distributed Computing and Internet Technology pp 255–266Cite as

Automated Test Scenario Selection Based on Levenshtein Distance

  • Conference paper

Part of the Lecture Notes in Computer Science book series (LNISA,volume 5966)

Abstract

Specification based testing involves generating test cases from the specification, here, UML. The number of automatically generated test scenarios from UML activity diagrams is large and hence impossible to test completely. This paper presents a method for selection of test scenarios generated from activity diagrams using Levenshtein distance. An activity diagram is transformed into a directed graph representing the sequence of activities. A modified Depth First Algorithm(DFS) is applied to obtain test scenarios. Levenshtein distance is calculated between the scenarios thus generated. The objective is to select the less similar test cases and at the same time provide maximum coverage.

Keywords

  • Specification based testing
  • Test Scenarios Selection
  • UML activity diagrams

This is a preview of subscription content, access via your institution.

Chapter
USD   29.95
Price excludes VAT (USA)
  • DOI: 10.1007/978-3-642-11659-9_28
  • Chapter length: 12 pages
  • Instant PDF download
  • Readable on all devices
  • Own it forever
  • Exclusive offer for individuals only
  • Tax calculation will be finalised during checkout
eBook
USD   74.99
Price excludes VAT (USA)
  • ISBN: 978-3-642-11659-9
  • Instant PDF download
  • Readable on all devices
  • Own it forever
  • Exclusive offer for individuals only
  • Tax calculation will be finalised during checkout
Softcover Book
USD   99.00
Price excludes VAT (USA)
Learn about institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. Cartaxo, E.G., Andrade, W.L., Neto, F.G.O., Machado, P.D.L.: LTS-BT: A tool to generate and select functional test cases for embedded systems. In: SAC 2008: Proceedings of the 2008 ACM symposium on Applied computing, pp. 1540–1544. ACM, New York (2008)

    CrossRef  Google Scholar 

  2. Sapna, P.G., Mohanty, H.: Automated Test Scenario Generation from UML Activity Diagrams. In: International Conference on Information Technology, ICIT, pp. 209–214 (2008)

    Google Scholar 

  3. Cartaxo, E.G., Neto, F.G.O., Machado, P.D.L.: Automated Test Case Selection Based on a Similarity Function. GI Jahrestagung (2), 399–404 (2007)

    Google Scholar 

  4. Srikanth, H., Williams, L.: On the economics of requirements-based test case prioritization. In: Proceedings of the Seventh International Workshop on Economics- Driven Software Engineering Research (2005)

    Google Scholar 

  5. Yoo, S., Harman, M.: Pareto efficient multi-objective test case selection. In: Proceedings of the 2007 International Symposium on Software Testing and Analysis, pp. 140–150 (2007)

    Google Scholar 

  6. Sapna, P.G., Mohanty, H.: Prioritization of scenarios based on UML Activity Diagrams. In: First International Conference on Computational Intelligence, Communication Systems and Networks (July 2009)

    Google Scholar 

  7. Chen, M., Mishra, P., Kalita, D.: Coverage-driven Automatic Test Generation for UML Activity Diagrams. In: ACM Great Lakes Symposium on VLSI (GLSVLSI) (May 2008)

    Google Scholar 

  8. Kim, H., Kang, S., Baik, J., Ko, I.: Test Cases Generation from UML Activity Diagrams. In: 8th ACIS International Conference on Software Engineering, Artificial Intelligence, Networking and Parallel/Distributed Computing(ACIS-SNPD). IEEE Computer Society, Los Alamitos (2007)

    Google Scholar 

  9. Mingsong, C., Xiaokang, Q., Xuandong, L.: Automatic Test Case Generation for UML Activity Diagrams. In: International Conference on Software Engineering, Proceedings of the 2006 International workshop on Automation of Software Test. ACM, New York (2006)

    Google Scholar 

  10. Ciupa, I., Leitner, A., Oriol, M., Meyer, B.: Object distance and its application to adaptive random testing of object-oriented programs. In: Proceedings of the 1st international workshop on Random testing, pp. 55–63. ACM, New York (2006)

    CrossRef  Google Scholar 

  11. Chen, T., Leung, H., Mak, I.: Adaptive random testing. In: Maher, M.J. (ed.) ASIAN 2004. LNCS, vol. 3321, pp. 320–329. Springer, Heidelberg (2004)

    CrossRef  Google Scholar 

  12. Basanieri, F., Bertolino, A., Marchetti, E.: The Cow Suite Approach to Planning and Deriving Test Suites in UML Projects. In: Jézéquel, J.-M., Hussmann, H., Cook, S. (eds.) UML 2002. LNCS, vol. 2460, p. 383. Springer, Heidelberg (2002)

    CrossRef  Google Scholar 

  13. Chen, Y., Probert, R.L.: A Risk-based Regression Test Selection Strategy. In: Proceeding of the 14th IEEE International Symposium on Software Reliability Engineering (ISSRE 2003), Fast Abstract, November, 2003, pp. 305–306 (2003)

    Google Scholar 

  14. Burguillo, J.C., Llamas, M., Fernndez, M.J., Robles, T.: Heuristic-driven Techniques for Test Case Selection. In: FMICS 2002, 7th International ERCIM Workshop in Formal Methods for Industrial Critical Systems (ICALP 2002 Satellite Workshop). Electronic Notes in Theoretical Computer Science, vol. 66(2), pp. 50–65 (2002)

    Google Scholar 

  15. Chen, Y., Probert, R.L., Sims, D.P.: Specification-based regression test selection with risk analysis. In: CASCON 2002: Proceedings of the 2002 conference of the Centre for Advanced Studies on Collaborative research. IBM Press (2002)

    Google Scholar 

  16. Burguillo-Rial, J.C., Fernández-Iglesias, M.J., González-Castaño, F.J., Llamas-Nistal, M.: Heuristic-driven test case selection from formal specifications. A case study. In: Eriksson, L.-H., Lindsay, P.A. (eds.) FME 2002. LNCS, vol. 2391, p. 57. Springer, Heidelberg (2002)

    CrossRef  Google Scholar 

  17. Elbaum, S., Malishevsky, A., Rothermel, G.: Test case prioritization. A family of empirical studies 28(2), 159–182 (2002)

    Google Scholar 

  18. Rothermel, G., Untch, R.H., Chu, C., Harrold, M.J.: Prioritizing test cases for regression testing. Software Engineering 27(10), 929–948 (2001)

    CrossRef  Google Scholar 

  19. Rothermel, G., Harrold, M.: A safe, efficient regression test selection technique. ACM Transactions on Software Engineering and Methodology 6(2), 173–210 (1997)

    CrossRef  Google Scholar 

  20. Rothermel, G., Harrold, M.J.: Analyzing Regression Test Selection Techniques. IEEE Transactions on Software Engineering 22(8), 529–551 (1996)

    CrossRef  Google Scholar 

  21. Levenshtein, V.I.: Binary codes capable of correcting deletions, insertions, and reversals. Doklady Akademii Nauk SSSR 163(4), 845–848 (1965)

    MathSciNet  MATH  Google Scholar 

Download references

Author information

Authors and Affiliations

  1. University of Hyderabad, Hyderabad, India

    Sapna P.G. & Hrushikesha Mohanty

Authors
  1. Sapna P.G.
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. Hrushikesha Mohanty
    View author publications

    You can also search for this author in PubMed Google Scholar

Editor information

Editors and Affiliations

  1. International Institute for Software Technology, Center for Electronic Governance, United Nations University, P.O. Box 3058, Macau, Japan

    Tomasz Janowski

  2. Department of Computer and Information Sciences, Central University PO, University of Hyderabad, 500 046, Hyderabad, AP, India

    Hrushikesha Mohanty

Rights and permissions

Reprints and Permissions

Copyright information

© 2010 Springer-Verlag Berlin Heidelberg

About this paper

Cite this paper

P.G., S., Mohanty, H. (2010). Automated Test Scenario Selection Based on Levenshtein Distance. In: Janowski, T., Mohanty, H. (eds) Distributed Computing and Internet Technology. ICDCIT 2010. Lecture Notes in Computer Science, vol 5966. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-11659-9_28

Download citation

  • DOI: https://doi.org/10.1007/978-3-642-11659-9_28

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-11658-2

  • Online ISBN: 978-3-642-11659-9

  • eBook Packages: Computer ScienceComputer Science (R0)