Abstract
Chemically prepared nanoparticles are an exceptional class of materials that owe their properties to both the three-dimensional confinement and their large surface area. To characterize their electronic and geometric structural properties, X-ray methods offer unique capabilities. In this chapter, we demonstrate how a combination of X-ray spectroscopy and X-ray diffraction techniques allows one to characterize these nanoparticles with respect to their local atomic properties, their long-range crystalline order and their nanoscale core–shell structure.
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Suljoti, E., Pietzsch, A., Wurth, W., Föhlisch, A. (2010). How X-Ray Methods Probe Chemically Prepared Nanoparticles from the Atomic- to the Nano-Scale. In: Heitmann, D. (eds) Quantum Materials, Lateral Semiconductor Nanostructures, Hybrid Systems and Nanocrystals. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-10553-1_17
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