Abstract
Testing is the most used technique for software verification: it is easy to use and even if no error is found, it can release a set of tests certifying the (partial) correctness of the compiled system. Moreover, in order to increase the confidence of the correctness of the compiled system, it is often required that the provided set of tests covers 100% of the code. This requirement, however, substantially increases the costs associated to the testing phase, since it may involve the manual generation of tests. In this paper we show how to use a Bounded Model Checker for C programs (CBMC) as an automatic test generator for the Coverage Analysis, and we show how its use can substantially reduce the costs of the testing phase.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
Clarke, E., Kroening, D., Lerda, F.: A Tool for Checking ANSI-C Program. In: Tools and Algorithms for the Construction and Analysis of Systems, pp. 168–176
ERTMS: The official Website, http://www.ertms.com/
Biere, A., Cimatti, A., Clarke, E.M., Strichman, O., Zhu, Y.: Bounded Model Checking. Advances inComputers 58
Moskewicz, W.M., Madigan, C.F., Zhao, Y., Zhang, L., Malik, S.: Chaff:Engineering an Efficient SAT Solver. In: Proceedings of the 38th Design Automation Conference, pp. 530–535
Cytron, R., Ferrante, J., Rosen, B.K., Wegman, M.N., Zadeck, F.K.: EfficientlyComputing Static Single Assignment Form and the Control DependenceGraph. ACM Transactions on Programming Languages and Systems 13(4), 451–490
European Committee forElectrotechnical Standardization. Railway Applications -Communication, signalling and processing systems - Software forrailway control and protection systems, http://www.cenelec.eu
Godefroid, P., Klarlund, N., Sen, K.: DART: Directed automated random testing. In: Proceedings of the ACM SIGPLAN Conference on Programming Language Design and Implementation, pp. 213–223
Een, N., Sorensson, N.: An ExtensibleSAT-solver. In: Satisfiability Workshop, pp. 502–518
Tillmann, N., Schulte, W.: Parameterized unit tests. In: Proceedings of the 10th European Software Engineering Conference Held Jointly with 13th ACM SIGSOFT international Symposium on Foundations of Software Engineering, pp. 253–261
Cadar, C., Dunbar, D., Engler, D.R.: KLEE: Unassisted and Automatic Generation of High-Coverage Tests for Complex Systems Programs. In: OSDI, pp. 209–224
Khurshid, S., Marinov, D.: TestEra: Specification-based testing of java programs using sat. Automated Software Engg., 403–434
Chockler, H., Kupferman, O., Kurshan, R.P., Vardi, M.Y.: A Practical Approach to Coverage in Model Checking. In: Berry, G., Comon, H., Finkel, A. (eds.) CAV 2001. LNCS, vol. 2102, pp. 66–78. Springer, Heidelberg (2001)
Tillmann, N., de Halleux, J.: Pex White Box Test Generation for.NET. In: Beckert, B., Hähnle, R. (eds.) TAP 2008. LNCS, vol. 4966, pp. 134–153. Springer, Heidelberg (2008)
de Halleux, J., Tillmann, N.: Parameterized unit testing with pex. Tests and Proofs, 171–181 (2008), http://dx.doi.org/10.1007/978-3-540-79124-9_12
Jackson, D., Shlyakhter, I., Sridharan, M.: A micromodularity mechanism. In: Proceedings of the 8th European Software Engineering Conference Held Jointly with 9th ACM SIGSOFT international Symposium on Foundations of Software Engineering, pp. 62–73
Vedula, V.M.: Hdl Slicing for Verification and Test, available electronically from http://hdl.handle.net/2152/1033
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2009 Springer-Verlag Berlin Heidelberg
About this paper
Cite this paper
Angeletti, D., Giunchiglia, E., Narizzano, M., Puddu, A., Sabina, S. (2009). Automatic Test Generation for Coverage Analysis Using CBMC. In: Moreno-DÃaz, R., Pichler, F., Quesada-Arencibia, A. (eds) Computer Aided Systems Theory - EUROCAST 2009. EUROCAST 2009. Lecture Notes in Computer Science, vol 5717. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-04772-5_38
Download citation
DOI: https://doi.org/10.1007/978-3-642-04772-5_38
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-04771-8
Online ISBN: 978-3-642-04772-5
eBook Packages: Computer ScienceComputer Science (R0)