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The influence of intracellular connections on the electric field induced membrane voltage and electroporation of cells in clusters

  • Conference paper
Book cover World Congress on Medical Physics and Biomedical Engineering, September 7 - 12, 2009, Munich, Germany

Part of the book series: IFMBE Proceedings ((IFMBE,volume 25/13))

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Abstract

In this paper we examine the influence of gap junction inhibition on the amplitude and distribution of the induced transmembrane voltage (ITV) and electroporation of cells in clusters. Cell clusters were used as they represent simple models of cells in tissues and thus enable the study of the effects of the external electric field on the level of individual cells. We demonstrated that cells in clusters respond differently to the electric field exposure, depending on the field parameters. Namely, when exposed to long, low voltage pulses (such as during the measurements of the ITV) cells in clusters behave as one giant, single cell. At short, high voltage pulses (such as during electroporation) they behave as individual cells. Different response of cells in clusters was attributed to the changes in the properties of gap junctions, specifically, their opening and closing. This was demonstrated by pre-treating the cells with gap junction inhibitor, which caused the cells in clusters to respond as individual cells, regardless of the pulse parameters.

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© 2009 International Federation for Medical and Biological Engineering

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Pucihar, G., Miklavčič, D. (2009). The influence of intracellular connections on the electric field induced membrane voltage and electroporation of cells in clusters. In: Dössel, O., Schlegel, W.C. (eds) World Congress on Medical Physics and Biomedical Engineering, September 7 - 12, 2009, Munich, Germany. IFMBE Proceedings, vol 25/13. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-03895-2_22

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  • DOI: https://doi.org/10.1007/978-3-642-03895-2_22

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-03894-5

  • Online ISBN: 978-3-642-03895-2

  • eBook Packages: EngineeringEngineering (R0)

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