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Polarization-Sensitive Tip-Enhanced Raman Scattering

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Scanning Probe Microscopy in Nanoscience and Nanotechnology

Part of the book series: NanoScience and Technology ((NANO))

Summary

Tip-Enhanced Raman Spectroscopy (TERS) is a very promising analytical technique for high sensitivity, high spatial resolution analysis of the physical and chemical properties of nanoscale materials including nanocrystals, biomolecules, carbon-based nanostructures and nanometer-size devices. Polarized TERS, in addition, offers novel opportunities for high contrast spectroscopy and imaging of semiconductor crystals and crystalline nanostructures. This chapter reviews the current state-of-the-art in polarization-sensitive TERS focusing the attention on the experimental implementations of the technique, on the light scattering properties of the metallic probes, on the Raman signal enhancement mechanisms and, finally, on the applications of this technique.

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Acknowledgements

D. Barchiesi and A. Hartschuh are acknowledged for careful reading of the manuscript. PGG acknowledges the Université de Technologie de Troyes and the Université du Sud Toulon-Var for financial support.

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Authors and Affiliations

  1. CNR-Istituto per i Processi Chimico-Fisici sez. Messina Salita Sperone, C.da Papardo, 98158, Messina, Italy

    Pietro Giuseppe Gucciardi

  2. Laboratoire de Chimie, Structure et Proprietes de Biomateriaux et c’Agents Therapeutiques, Université Paris 13, SFR SMBH, 74 rue Marcel Cachin, 93017, Bobigny, France

    Marc Lamy de La Chapelle

  3. IM2NP CNRS-UMR 6242, Université du Sud Toulon Var, BP, 20132 83957, La Garde, France

    Jean-Christophe Valmalette

  4. LPICM, Ecole Polytechnique CNRS, 91128, Palaiseau, France

    Gennaro Picardi & Razvigor Ossikovski

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  1. Pietro Giuseppe Gucciardi
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  2. Marc Lamy de La Chapelle
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  3. Jean-Christophe Valmalette
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  4. Gennaro Picardi
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  5. Razvigor Ossikovski
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Corresponding author

Correspondence to Pietro Giuseppe Gucciardi .

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  1. Nanoprobe Lab. Bio- & Nanotechnology &, Ohio State University, West 19th Avenue 201, Columbus, 43210-1142, U.S.A.

    Bharat Bhushan

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Gucciardi, P.G., de La Chapelle, M.L., Valmalette, JC., Picardi, G., Ossikovski, R. (2010). Polarization-Sensitive Tip-Enhanced Raman Scattering. In: Bhushan, B. (eds) Scanning Probe Microscopy in Nanoscience and Nanotechnology. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-03535-7_3

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