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Dynamic Force Microscopy and Spectroscopy Using the Frequency-Modulation Technique in Air and Liquids

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Scanning Probe Microscopy in Nanoscience and Nanotechnology

Part of the book series: NanoScience and Technology ((NANO))

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Summary

The frequency-modulation (FM) mode was introduced in 1991 to increase the sensitivity of dynamic force microscopy in vacuum. However, it is also possible to use this technique in air and liquids which has several advantages compared with the conventional amplitude-modulation (AM) (“tapping”) mode. In this chapter, we review the fundamentals of the FM mode and analyze its basic theoretical background. Finally, we present experimental results obtained in air and liquids and compare them with the conventional AM technique.

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Acknowledgements

The authors would like to thank X. Chen and L. Chi for the preparation of the DPPC sample. Furthermore, we acknowledge support from and many useful discussions with André Schirmeisen, Harald Fuchs (University of Münster), and Filipp Oesterhelt (University of Düsseldorf). This work was supported by the BMBF Junior Researchers Competition Nanotechnology (Grant No. 03N8704).

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Authors and Affiliations

  1. Institute for Microstructure Technology (IMT) Karlsruhe Institute for Technology (KIT), 3640, 76021, Karlsruhe, Germany

    Hendrik Hölscher

  2. Center for Nanotechnology (CeN Tech), Heisenbergstr. 11, 48149, Münster, Germany

    Daniel Ebeling & Jan-Erik Schmutz

  3. nanoAnalytics GmbH, Heisenbergstr. 11, 48149, Münster, Germany

    Marcus M. Schäefer

  4. Nano Analytics GmbH, Heisenbergstr. 11, 48149, Münster, Germany

    Boris Anczykowski

Authors
  1. Hendrik Hölscher
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  2. Daniel Ebeling
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  3. Jan-Erik Schmutz
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  4. Marcus M. Schäefer
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  5. Boris Anczykowski
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Corresponding author

Correspondence to Hendrik Hölscher .

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Editors and Affiliations

  1. Nanoprobe Lab. Bio- & Nanotechnology &, Ohio State University, West 19th Avenue 201, Columbus, 43210-1142, U.S.A.

    Bharat Bhushan

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Hölscher, H., Ebeling, D., Schmutz, JE., Schäefer, M.M., Anczykowski, B. (2010). Dynamic Force Microscopy and Spectroscopy Using the Frequency-Modulation Technique in Air and Liquids. In: Bhushan, B. (eds) Scanning Probe Microscopy in Nanoscience and Nanotechnology. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-03535-7_1

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