Lateral Shearing Interferometry with Simultaneous Detection of both Gradient Fields on a Common Detector Grid
Planar wave fronts with small deviations from a constant phase can be tested using lateral shearing interferometry. The incoming wave front is split in to two identical copies which are laterally shifted with respect to each other. Their superposition gives, in a first approximation, the gradient component of the wave front under test along the direction of the shear. To reconstruct the original wave front, a second measurement with a shear along the orthogonal direction is necessary.
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This project is supported by the Deutsche Forschungsgemeinschaft.