Lateral Shearing Interferometry with Simultaneous Detection of both Gradient Fields on a Common Detector Grid

  • Vanusch Nercissian
  • Norbert Lindlein
  • Klaus Mantel
  • Irina Harder
Chapter

Planar wave fronts with small deviations from a constant phase can be tested using lateral shearing interferometry. The incoming wave front is split in to two identical copies which are laterally shifted with respect to each other. Their superposition gives, in a first approximation, the gradient component of the wave front under test along the direction of the shear. To reconstruct the original wave front, a second measurement with a shear along the orthogonal direction is necessary.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

Notes

Acknowledgments

This project is supported by the Deutsche Forschungsgemeinschaft.

References

  1. 1.
    Schreiber, H, Schwider, J (1997) Lateral shearing interferometer based on two Ronchi phase gratings in series. Applied Optics 36:5321-5324CrossRefGoogle Scholar
  2. 2.
    Takeda, M, Ina, H, Kobayashi, S (1982) Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry. Journal of the Optical Society of America 72:156-160CrossRefGoogle Scholar
  3. 3.
    Schwider, J, Burow, R, Elssner, K-E, Grzanna, J, Spolaczyk, R, Merkel, K (1983) Digital wave-front measuring interferometry: some systematic error sources. Applied Optics 22:3421-3432CrossRefGoogle Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 2009

Authors and Affiliations

  • Vanusch Nercissian
    • 1
  • Norbert Lindlein
    • 1
  • Klaus Mantel
    • 2
  • Irina Harder
    • 2
  1. 1.Institute of OpticsInformation and Photonics University of Erlangen-NürnbergErlangenGermany
  2. 2.Max Planck Institute for the Science of LightErlangenGermany

Personalised recommendations