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Magnetic Exchange Force Microscopy

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Book cover Noncontact Atomic Force Microscopy

Part of the book series: NanoScience and Technology ((NANO))

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Abstract

Magnetic exchange force microscopy is a novel noncontact atomic-force microscopy based technique to image the arrangement of magnetic moments at surfaces with atomic resolution using sharp magnetic tips. Recent results obtained with iron coated silicon tips on two magnetically different antiferromagnetic surfaces are reviewed: NiO(001), an insulator, where the spin-carrying d-electrons are localized and interact via superexchange and Fe/W(001), a metal with delocalized spin-carrying d-electrons. The experimental findings are discussed with respect to the tip configuration, the role of an applied magnetic field, the magnitude of the magnetic signal as well as the interplay between chemical and magnetic forces.

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Authors and Affiliations

  1. Institute of Applied Physics, University of Hamburg, Jungiusstrasse 11, 20355, Hamburg, Germany

    Alexander Schwarz, Uwe Kaiser, Rene Schmidt & Roland Wiesendanger

Authors
  1. Alexander Schwarz
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  2. Uwe Kaiser
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  3. Rene Schmidt
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  4. Roland Wiesendanger
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Corresponding author

Correspondence to Alexander Schwarz .

Editor information

Editors and Affiliations

  1. Graduate School of Engineering, Dept. of Electrical, Electronic and, Osaka University, Yamada-Oka 2-1, Suita, 565-0871, Japan

    Seizo Morita

  2. Institut für Experimentelle und, Angewandte Physik, Universität Regensburg, Universitätsstr. 31, Regensburg, 93053, Germany

    Franz J. Giessibl

  3. FB Physik, Inst. Angewandte Physik, Universität Hamburg, Jungiusstr. 11, Hamburg, 20355, Germany

    Roland Wiesendanger

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Schwarz, A., Kaiser, U., Schmidt, R., Wiesendanger, R. (2009). Magnetic Exchange Force Microscopy. In: Morita, S., Giessibl, F., Wiesendanger, R. (eds) Noncontact Atomic Force Microscopy. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-01495-6_13

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