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The Use of Scattering and Spectroscopic Synchrotron Radiation Methods in Materials Science

Chapter
Part of the Lecture Notes in Physics book series (LNP, volume 776)

Abstract

Materials science is a very broad research field in which a variety of X-ray-based characterisation techniques play an important role in determining the structure of the materials under investigation. However, these techniques can also be used in many ways to determine the dynamic material properties and the influence that a variety of parameters can have on the final material properties during the manufacturing process. In many instances the high intensity and collimation of synchrotron radiation sources are beneficial, and often required, to obtain the desired information. This can be for instance the case in time-resolved X-ray scattering experiments but also in many imaging techniques where a low divergence but large beam size and tunable photon energy can render much better results compared to conventional X-ray sources. For X-ray spectroscopic techniques the tunability of the photon energy practically confines them at present to accelerator-based central laboratories. In this chapter an overview of some new developments and existing possibilities will be discussed. The main emphasis will be on X-ray scattering techniques on materials that evolve from an amorphous towards a more ordered state.

Keywords

Beam Line Colloidal Crystal Technique Combination WAXS Pattern SAXS Data 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 2009

Authors and Affiliations

  1. 1.Netherlands Organization for Scientific Research (NWO) DUBBLE CRG@ESRFBP 220 F38043 GrenobleFrance

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