Abstract
We demonstrate a new method to image optical-field ionized (OFI) plasmas. Ultrashort electron pulses are directed onto a laser plasma. The deflection allows determination of features such as the field distribution or plasma charge.
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Centurion, M., Reckenthaeler, P., Trushin, S.A., Krausz, F., Fill, E. (2009). Picosecond electron deflectometry of optical-field ionized plasmas. In: Corkum, P., Silvestri, S., Nelson, K., Riedle, E., Schoenlein, R. (eds) Ultrafast Phenomena XVI. Springer Series in Chemical Physics, vol 92. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-95946-5_53
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DOI: https://doi.org/10.1007/978-3-540-95946-5_53
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