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Atomic Motion in Laser Excited Bismuth Studied with Femtosecond X-Ray Diffraction

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Book cover Ultrafast Phenomena XVI

Part of the book series: Springer Series in Chemical Physics ((CHEMICAL,volume 92))

Abstract

Asymmetric grazing incidence femtosecond x-ray diffraction is applied to investigate carrier transport, carrier relaxation and phonon coupling in laser excited bismuth crystals.

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Author information

Authors and Affiliations

  1. Swiss Light Source, Paul Scherrer Institut, 5232, Villigen, Switzerland

    Paul Beaud, Steven L. Johnson, Faton S. Krasniqi, Ekaterina Vorobeva & Gerhard Ingold

  2. Laboratoire de Spectroscopie Ultrarapide, Ecole Polytechnique Fédérale de Lausanne, 1015, Lausanne, Switzerland

    Christopher J. Milne

Authors
  1. Paul Beaud
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  2. Steven L. Johnson
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  3. Christopher J. Milne
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  4. Faton S. Krasniqi
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  5. Ekaterina Vorobeva
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  6. Gerhard Ingold
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Editor information

Editors and Affiliations

  1. National Research Council Canada, Sussex Drive 100, Ottawa, K1A 0R6, Canada

    Paul Corkum

  2. Dipto. Fisica, Politecnico di Milano, Piazza Leonardo da Vinci 32, Milano, 20133, Italy

    Sandro Silvestri

  3. Technology (MIT), Massachusetts Institute of, Massachusetts Ave. 77, Cambridge, 02139, USA

    Keith A. Nelson

  4. Sektion Physik, Univ. München, Oettingenstr. 67, München, 80538, Germany

    Eberhard Riedle

  5. Lawrence Berkeley National Laboratory, University of California, Cyclotron Road 1, Berkeley, 94720, USA

    Robert W. Schoenlein

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© 2009 Springer-Verlag Berlin Heidelberg

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Beaud, P., Johnson, S.L., Milne, C.J., Krasniqi, F.S., Vorobeva, E., Ingold, G. (2009). Atomic Motion in Laser Excited Bismuth Studied with Femtosecond X-Ray Diffraction. In: Corkum, P., Silvestri, S., Nelson, K., Riedle, E., Schoenlein, R. (eds) Ultrafast Phenomena XVI. Springer Series in Chemical Physics, vol 92. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-95946-5_34

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  • DOI: https://doi.org/10.1007/978-3-540-95946-5_34

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-95945-8

  • Online ISBN: 978-3-540-95946-5

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