Abstract
Preferred crystallographic orientation or texture is a typically observed phenomenon in polycrystalline thin films. In addition, texture was revealed in numerous x-ray diffraction studies to increase with layer thickness. The phenomenon is rather significant for the optimized preparation of thin films, but was difficult to measure so far. A method is presented that allows for texture profiling by exploiting the anomalous variation of the x-ray attenuation coefficient in the vicinity of an elemental absorption edge. The study reports the application of the technique to thin ZnO:Al films by measuring with wavelengths below and above the Zn K edge. Large texture gradients between 0.03 and 0.3 mrd/nm were revealed to arise in these samples. Anomalous diffraction is concluded to enable the determination of texture gradients as required in many thin film projects.
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Birkholz, M., Darowski, N., Zizak, I. (2009). Profiling of Fiber Texture Gradients by Anomalous X-ray Diffraction. In: Haug, R. (eds) Advances in Solid State Physics. Advances in Solid State Physics, vol 48. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-85859-1_27
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DOI: https://doi.org/10.1007/978-3-540-85859-1_27
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