Skip to main content

Experimental Results of Coupled E-Field Sensor

  • Chapter
Applications of Nonlinear Dynamics

Part of the book series: Understanding Complex Systems ((UCS))

  • 2103 Accesses

Abstract

In this paper, we propose an electric field sensor made up of three unidirectionally coupled bistable Duffing elements. Each element in the sensor will oscillate if the coupling exceeds a threshold value. Then, we present some experimental results on the behavior and sensitivity of the sensor at the onset of bifurcation with and without an external input signal.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 129.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 169.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD 169.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. V. In, A. Palacios, A. R. Bulsara, et al., Phys. Rev. E 73, 066121 (2006)

    Article  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2009 Springer-Verlag Berlin Heidelberg

About this chapter

Cite this chapter

Liu, N. (2009). Experimental Results of Coupled E-Field Sensor. In: In, V., Longhini, P., Palacios, A. (eds) Applications of Nonlinear Dynamics. Understanding Complex Systems. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-85632-0_39

Download citation

Publish with us

Policies and ethics