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An improved detection system for low energy Scanning Transmission Electron Microscopy

  • Conference paper
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany

Abstract

In the last few years the STEM technique in standard SEMs has become a complementary approach to HAADF-STEM at high energy [1, 4], at least when high resolution is not required, as demonstrated by the availability of STEM attachments for all the commercial SEMs.

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References

  1. V. Morandi and P.G. Merli, Journal of Applied Physics 101 (2007), p. 114917.

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  2. V. Morandi et al., Applied Physics Letters 90 (2007), p. 163113.

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  3. C. Probst et al., Micron 38 (2007), p.402.

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  4. V. Van Ngo et al., Microscopy Today 15 Vol. 2 (2007), p. 12.

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  5. This work was supported by the EU Project ANNA, contract n. 026134 (RII3).

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© 2008 Springer-Verlag Berlin Heidelberg

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Morandi, V., Migliori, A., Maccagnani, P., Ferroni, M., Tamarri, F. (2008). An improved detection system for low energy Scanning Transmission Electron Microscopy. In: Luysberg, M., Tillmann, K., Weirich, T. (eds) EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-85156-1_291

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