Abstract
This paper presents an innovative approach for the generation of test programs detecting path-delay faults in microprocessors. The proposed method takes advantage of the multiobjective implementation of a previously devised evolutionary algorithm and exploits both gate- and RT-level descriptions of the processor: the former is used to build Binary Decision Diagrams (BDDs) for deriving fault excitation conditions; the latter is used for the automatic generation of test programs able to excite and propagate fault effects, based on a fast RTL simulation. Experiments on an 8-bit microcontroller show that the proposed method is able to generate suitable test programs more efficiently compared to existing approaches.
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MicroGP++, http://ugp3.sourceforge.net
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Bernardi, P., Christou, K., Grosso, M., Michael, M.K., Sánchez, E., Reorda, M.S. (2008). Exploiting MOEA to Automatically Geneate Test Programs for Path-Delay Faults in Microprocessors. In: Giacobini, M., et al. Applications of Evolutionary Computing. EvoWorkshops 2008. Lecture Notes in Computer Science, vol 4974. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-78761-7_23
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DOI: https://doi.org/10.1007/978-3-540-78761-7_23
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-78760-0
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