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Non-Destructive Testing for Cracks in Special Conductive Materials

  • Jarmila Dedkova
Part of the Studies in Computational Intelligence book series (SCI, volume 119)

Abstract

In this paper we propose new approaches for recovering conductivity distribution of special structures called honeycombs using electric impedance tomography (EIT). There is presented that algorithms based on stochastic methods are suitable for the detection of some cracks in the conductive honeycombs. There are compared numerical results obtained using stochastic method and using widely known deterministic methods.

Keywords

Genetic Algorithm Surface Conductivity Impedance Tomography Differential Evolution Algorithm Stochastic Method 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 2008

Authors and Affiliations

  • Jarmila Dedkova
    • 1
  1. 1.FEEC BUTBrnoCzech Republic

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