Non-Destructive Testing for Cracks in Special Conductive Materials
In this paper we propose new approaches for recovering conductivity distribution of special structures called honeycombs using electric impedance tomography (EIT). There is presented that algorithms based on stochastic methods are suitable for the detection of some cracks in the conductive honeycombs. There are compared numerical results obtained using stochastic method and using widely known deterministic methods.
KeywordsGenetic Algorithm Surface Conductivity Impedance Tomography Differential Evolution Algorithm Stochastic Method
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- 2.L. Dedek and J. Dedkova, Evaluation of thin layer conductivity in a volume using electrical impedance tomography, Proceedings BIOSIGNAL 2004, Brno VUTIUM, p. 3.Google Scholar
- 6.Z. Michalewicz, Genetic Algorithms+Data Structure =Evolution Programs. 2nd ed. Springer Verlag, Berlin Heidelberg New York, 1994.Google Scholar