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Non-Destructive Testing for Cracks in Special Conductive Materials

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Intelligent Computer Techniques in Applied Electromagnetics

Part of the book series: Studies in Computational Intelligence ((SCI,volume 119))

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Abstract

In this paper we propose new approaches for recovering conductivity distribution of special structures called honeycombs using electric impedance tomography (EIT). There is presented that algorithms based on stochastic methods are suitable for the detection of some cracks in the conductive honeycombs. There are compared numerical results obtained using stochastic method and using widely known deterministic methods.

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© 2008 Springer-Verlag Berlin Heidelberg

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Dedkova, J. (2008). Non-Destructive Testing for Cracks in Special Conductive Materials. In: Wiak, S., Krawczyk, A., Dolezel, I. (eds) Intelligent Computer Techniques in Applied Electromagnetics. Studies in Computational Intelligence, vol 119. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-78490-6_36

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  • DOI: https://doi.org/10.1007/978-3-540-78490-6_36

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-78489-0

  • Online ISBN: 978-3-540-78490-6

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