Determination of Complex Permittivity of LRR Radome Materials Using a Scalar Quasi-Optical Measurement System
We developed a low-cost quasi-optical measurement system to determine the complex permittivity in the E-band (from 60 to 90 GHz). The evaluation is done in a non-destructive way and can be used for all kinds of single-layered and multi-layered dielectric materials. The method is based on measurements of the scalar transmission coefficient through planar samples for several angles of incidence and two different polarization states (parallel and perpendicular to the plane of incidence). A numerical optimization technique is used to derive the complex permittivity from the measured coefficients. The method utilizes a physical model of a dielectric slab of known thickness, which assumes that a plane wave is incident on the surface of the dielectric material. Measurement results are presented, which are in good agreement with data from the literature.
Keywordscomplex permittivity quasi-optical measurement microwave measurement material characterization
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