Model-Based Correlation Measure for Nonuniformity Gain and Offset Parameters of Infrared Focal-Plane-Array Sensors

  • César San Martin
  • Sergio N. Torres
Conference paper
Part of the Lecture Notes in Computer Science book series (LNCS, volume 4756)

Abstract

In this paper, we proposed a model based correlation measure between gain and offset nonuniformity for infrared focal plane array (FPA) imaging systems. Actually, several nonuniformity correction methods perform correction of nonuniformities by means of gain and offset estimation in a detector-by-detector basis using several approach such as laboratory calibration methods, registration-based algorithm, and algebraic and statistical scene-based algorithm. Some statistical algorithms model the slow and random drift in time that the gain and offset present in many practical FPA applications by means of Gauss-Markov model, assuming that the gain and offset are uncorrelated. Due to this, in this work we present a study and model of such correlation by means of a generalized Gauss-Markov model. The gain and offset model-based correlation is validate using several infrared video sequences.

Keywords

Gauss-Markov Model Image Sequence Processing Infrared FPA Signal Processing 

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Copyright information

© Springer-Verlag Berlin Heidelberg 2007

Authors and Affiliations

  • César San Martin
    • 1
    • 2
  • Sergio N. Torres
    • 1
  1. 1.Department of Electrical Engineering, University of Concepción., Casilla 160-C, ConcepciónChile
  2. 2.Department of Electrical Engineering, University of La Frontera., Casilla 54-D, TemucoChile

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