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A Multiple Substructure Matching Algorithm for Fingerprint Verification

  • Mabel Iglesias Ham
  • Yilian Bazán Pereira
  • Edel B. García Reyes
Part of the Lecture Notes in Computer Science book series (LNCS, volume 4756)

Abstract

In this paper, we represent a fingerprint image with a Delaunay graph formed by minutiae as nodes. The graph has attributes which contributes to the final similarity measure and are invariant under rotation and translation. We design an algorithm for the comparison of these graphs based on the similarities of multiple common substructures. We use different heuristics to tackle the problems of noise, deformation and partial matching found in fingerprint recognition. We match star structures and extend it by edges maintaining the local structural compatibility. Finally, we consolidate the global similarity taking into account the size of the common substructures and the accumulated similarity of all stars involved. We use a simple greedy algorithm obtaining a very efficient performance. We use our proposed method in some experiments with fingerprint images in databases from FVC2002. It shows better results compared to other known algorithms as K-plet, and several others recently published.

Keywords

graph matching fingerprint recognition Delaunay triangulation 

References

  1. 1.
    Federal Bureau of Investigation: The Science of Fingerprints: Classification and Uses. Washington, D.C.: U.S. Government Printing Office (1984)Google Scholar
  2. 2.
    Kovacs-Vajna, Z.M.: A fingerprint verification system based on triangular matching and dynamic time warping. IEEE Trans. PAMI 22(11), 1266–1276 (2000)Google Scholar
  3. 3.
    Deng, H., Huo, O.: Minutiae Matching Based Fingerprint Verification Using Delaunay Triangulation and Aligned- Edge-Guided Triangle Matching. In: Kanade, T., Jain, A., Ratha, N.K. (eds.) AVBPA 2005. LNCS, vol. 3546, pp. 270–278. Springer, Heidelberg (2005)Google Scholar
  4. 4.
    Jiang, X., Yau, W.Y.: Fingerprint minutiae matching based on the local and global structures. In: Proc. Internat. Conf. on Pattern Recognition, pp. 1038–1104 (2000)Google Scholar
  5. 5.
    Isenor, D.K., Zaky, S.G.: Fingerprint Identification Using Graph Matching. Pattern Recognition 19(2), 113–122 (1986)CrossRefGoogle Scholar
  6. 6.
    Chikkerur, S., Govindaraju, V.: K-plet and CBFS: A graph based fingerprint representation and matching algorithm. In: International Conference on Biometrics (2006)Google Scholar
  7. 7.
    Ratha, N., Bolle, R., Pandit, V., Vaish, V.: Robust fingerprint authentication using local structural similarity. In: 15th IEEE Workshop on Applications of Computer Vision, pp. 29–34 (2000)Google Scholar
  8. 8.
    Bebis, G., Deaconu, T., Georgiopoulos, M.: Fingerprint identification using Delaunay triangulation. In: Int. Conf. on Information Intelligence and Systems, pp. 452–459 (1999)Google Scholar
  9. 9.
    Parziale, G., Niel, A.: A Fingerprint Matching Using Minutiae Triangulation. In: Zhang, D., Jain, A.K. (eds.) ICBA 2004. LNCS, vol. 3072, pp. 241–248. Springer, Heidelberg (2004)Google Scholar
  10. 10.
    Guibas, L., Stolfi, J.: Primitives for the Manipulation of General Subdivisions and the Computation of Voronoi Diagrams. ACT TOG 4(2) (1985)Google Scholar
  11. 11.
    Sloan, S.W., Houlsby, G.T.: An Implementation of Watson’s Algorithm for Computing 2-D Delaunay Triangulations. Advanced Engineering Software 6(4) (1984)Google Scholar
  12. 12.
    Tuceryan, M., Chorzempa, T.: Relative Sensitivity of a Family of Closest-Point Graphs in Computer Vision Applications. Pattern Recognition 24(5), 361–373 (1991)CrossRefGoogle Scholar
  13. 13.
    FVC2004. Fingerprint Verification Competition, url: http://bias.csr.unibo.it/fvc2004/
  14. 14.
    Feng, Y., Feng, J., Chen, X., Song, Z.: A novel fingerprint matching scheme based on local structure compatibility. In: Int. Conf. on Pattern Recognition (2006)Google Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 2007

Authors and Affiliations

  • Mabel Iglesias Ham
    • 1
  • Yilian Bazán Pereira
    • 1
  • Edel B. García Reyes
    • 1
  1. 1.Adv. Tech.Application Center 7a No. 21812, Siboney, Miramar, 12200, HabanaCuba

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