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Unambiguous Dynamic Diffraction Patterns for 3D Depth Profile Measurement

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Pattern Recognition (DAGM 2007)

Part of the book series: Lecture Notes in Computer Science ((LNIP,volume 4713))

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Abstract

The projection of fixed patterns in active 3d measurement systems is deteriorated by ambient lighting. Moreover classic projection patterns lead to ambiguities during pattern detection in the digital signal processing phase. Therefore a dynamic, diffraction based pattern projection system is introduced which can adapt to ambient lighting conditions. For error-free laser pattern detection a method for the design of unambiguous projection patterns is presented.

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Authors and Affiliations

  1. Communication Technology Institute, University of Dortmund, Germany

    Dominik Lubeley

Authors
  1. Dominik Lubeley
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Fred A. Hamprecht Christoph Schnörr Bernd Jähne

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© 2007 Springer-Verlag Berlin Heidelberg

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Lubeley, D. (2007). Unambiguous Dynamic Diffraction Patterns for 3D Depth Profile Measurement. In: Hamprecht, F.A., Schnörr, C., Jähne, B. (eds) Pattern Recognition. DAGM 2007. Lecture Notes in Computer Science, vol 4713. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-74936-3_5

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  • DOI: https://doi.org/10.1007/978-3-540-74936-3_5

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-74933-2

  • Online ISBN: 978-3-540-74936-3

  • eBook Packages: Computer ScienceComputer Science (R0)

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