Unambiguous Dynamic Diffraction Patterns for 3D Depth Profile Measurement

  • Dominik Lubeley
Conference paper
Part of the Lecture Notes in Computer Science book series (LNCS, volume 4713)


The projection of fixed patterns in active 3d measurement systems is deteriorated by ambient lighting. Moreover classic projection patterns lead to ambiguities during pattern detection in the digital signal processing phase. Therefore a dynamic, diffraction based pattern projection system is introduced which can adapt to ambient lighting conditions. For error-free laser pattern detection a method for the design of unambiguous projection patterns is presented.


Object Space Pattern Point Spatial Light Modulator Epipolar Line Pattern Matrix 
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Copyright information

© Springer-Verlag Berlin Heidelberg 2007

Authors and Affiliations

  • Dominik Lubeley
    • 1
  1. 1.Communication Technology Institute, University of DortmundGermany

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