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Part of the book series: Lecture Notes in Computer Science ((LNTCS,volume 4644))

Abstract

The application of asynchronous circuit has been greatly restricted by reason of lacking effective technologies to test. Making use of the self-checking property of asynchronous control circuit, we may preferably solve this problem. In the paper, we put forward an improved, fail-stop David Cell, describe a way of designing self-checking asynchronous control circuits by the direct mapping technique, and propose the testing method for single stuck-at faults. The result shows that self-checking counterpart can be tested at normal operation speed and the area overhead is acceptable.

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Nadine Azémard Lars Svensson

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© 2007 Springer-Verlag Berlin Heidelberg

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Ruan, J., Wang, Z., Dai, K., Li, Y. (2007). Design and Test of Self-checking Asynchronous Control Circuit. In: Azémard, N., Svensson, L. (eds) Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation. PATMOS 2007. Lecture Notes in Computer Science, vol 4644. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-74442-9_31

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  • DOI: https://doi.org/10.1007/978-3-540-74442-9_31

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-74441-2

  • Online ISBN: 978-3-540-74442-9

  • eBook Packages: Computer ScienceComputer Science (R0)

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